Compressed Sensing for Two-Qubit Correlated Dephasing Error Detection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current technologies face challenges in efficiently characterizing and detecting two-qubit correlated dephasing errors in noisy intermediate-scale quantum information (NISQ) devices, which are crucial for improving performance and ensuring accurate results.

Innovation Solution

A computer-implemented method is developed to detect two-qubit correlated dephasing errors by accessing a signal from a quantum system, performing randomized measurements of off-diagonal elements, and recovering a matrix based on direct measurements of diagonal elements, utilizing techniques such as Ramsey spectroscopy and compressed sensing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional measurement methods are used to characterize noise processes in NISQ devices, then measurement precision can be achieved, but the complexity of the measurement process and device operation increases significantly

Engineering Contradiction:
Improvenoise process characterization accuracyVSAvoidmeasurement process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the noise characterization problem by measuring only the diagonal elements of the correlation matrix (single-qubit dephasing rates) rather than all elements. This segmentation reduces the measurement complexity from O(n^2) to O(n) while maintaining sufficient precision for characterizing the dominant noise processes in NISQ devices.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent extracts only the essential information needed for noise characterization - the diagonal elements of the correlation matrix - while discarding the off-diagonal elements. This extraction approach simplifies the measurement process and reduces operational complexity while preserving the key noise characteristics required for error correction.

Inventive Principle:
Principle #2Taking out (Extraction)

2Measurement precision

If complete correlation matrix measurement is performed, then measurement precision improves, but the time required for measurement increases

Engineering Contradiction:
Improvecorrelation matrix accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial action by measuring only a subset (the diagonal elements) of the correlation matrix rather than the complete matrix. This partial measurement approach reduces measurement time from O(n^2) to O(n) while providing sufficient precision for the intended application of noise characterization and error correction in NISQ devices.

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If randomized measurements of off-diagonal elements are performed, then measurement precision improves, but device complexity and operational difficulty increase

Engineering Contradiction:
Improveoff-diagonal element detectionVSAvoidmeasurement operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent extracts and measures only the diagonal elements of the correlation matrix, which correspond to single-qubit dephasing rates. By taking out only these essential diagonal elements and ignoring the off-diagonal elements, the patent significantly simplifies the measurement operations while maintaining sufficient precision for noise characterization.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of measuring all elements including the complex off-diagonal elements, the patent inverts the approach by focusing exclusively on the diagonal elements. This inversion simplifies the measurement process and makes operations easier while still capturing the dominant noise characteristics.

Inventive Principle:
Principle #13The other way round (Inversion)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method effectively estimates two-qubit correlated dephasing errors, improving the characterization of noise processes in NISQ devices and enhancing their performance through calibration and error correction.

Implementation Method 1

Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing

Methodology Applied
Scientific EffectDephasing:

Implementation Method 2

measuring a linear function of a correlation matrix, where the correlation matrix corresponds to correlated Markovian dephasing between pairs of qubits

Methodology Applied
Scientific EffectQuantum correlation:

Implementation Method 3

dephasing entangled states of the plurality of qubits based on performing Ramsey spectroscopy using entangled states of random subsets of qubits

Methodology Applied
Scientific EffectRamsey spectroscopy:

Implementation Method 4

recovering the matrix based on a direct measurement of the diagonal elements of the matrix

Methodology Applied
Scientific EffectCompressed sensing:

Data Source

PatentUS12288136B2Systems and methods for compressed sensing measurement of long-range correlated noise
Publication Date: 2025.04.29 UNIV OF MARYLAND
  • US12288136B2 patent drawing
  • US12288136B2 patent drawing
  • US12288136B2 patent drawing

AI summary

A method for detecting a two-qubit correlated dephasing error includes accessing a signal of a quantum system, where the quantum system includes a plurality of qubits. Every qubit has a nonzero rate of dephasing and some qubits have a nonzero rate of correlated dephasing. The signal further includes information about a matrix that includes diagonal elements and off-diagonal elements. The off-diagonal elements of the matrix are 2s-sparse. The method further includes performing randomized measurements of the off-diagonal elements of the matrix and recovering the matrix based on a direct measurement of the diagonal elements of the matrix.