Concurrent Data Packet Signal Transceiver Testing

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Solution Overview

Problem

Current methods for testing multiple Bluetooth devices concurrently require significant compromises in test speed and cost, as they often necessitate fewer signal sources and analyzers than devices, leading to inefficiencies in signal analysis and prolonged testing times.

Innovation Solution

A method involving a tester that exchanges sequences of test data packets with multiple data packet signal transceivers, where the transceivers provide summary data packets indicating correctly received bits, allowing for concurrent testing with reduced test time and cost by replicating a common test data packet signal and receiving summary data packets from each device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple devices are tested with multiple concurrently operating test systems, then test accuracy and reliability are improved, but capital cost increases significantly

Engineering Contradiction:
Improvetest accuracyVSAvoidcapital cost
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A single test system is designed to perform multiple testing functions by sequentially testing different devices. The test system includes a signal source that can generate test signals for multiple Bluetooth devices and a received signal analyzer that can analyze signals from multiple devices at different times, eliminating the need for dedicated test systems for each device.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Multiple testing functions are merged into a single test system through the use of signal splitters and multiplexors. The signal source is connected to multiple devices via signal splitters, and the received signal analyzer is connected via multiplexors that can switch between different devices, combining multiple test operations into one integrated system.

Inventive Principle:
Principle #5Merging (Combining)

2Device complexity

If signal splitters and multiplexors are used to accommodate multiple DUTs with a single tester, then capital cost is reduced, but test speed decreases due to sequential signal analysis

Engineering Contradiction:
Improvecapital costVSAvoidtest speed
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The test system performs preliminary actions by sending test signals to multiple devices simultaneously through signal splitters before sequentially analyzing the received signals. This allows the testing process to start with parallel signal generation, and the sequential analysis is optimized by using summary data packets that contain aggregated results from multiple devices.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The test system creates copies of test signals by using signal splitters to replicate the same test signal to multiple different devices simultaneously. This allows parallel testing of multiple devices with identical test conditions, and the results are aggregated using summary data packets that contain information about correctly received bits from all devices.

Inventive Principle:
Principle #26Copying

3Device complexity

If received signals are multiplexed and captured successively rather than concurrently, then a single analyzer can handle multiple devices, but measurement time increases

Engineering Contradiction:
Improvenumber of analyzersVSAvoidmeasurement time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The test system uses feedback mechanisms where devices send summary data packets back to the analyzer containing information about correctly received bits. This feedback allows the system to efficiently measure bit error rates without requiring concurrent analysis of all devices, as the summary data packets aggregate results that can be processed sequentially.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system changes the measurement approach by using summary data packets that aggregate bit error rate information from multiple devices. Instead of analyzing each device's signal separately and concurrently, the system uses parameter aggregation to combine results, allowing sequential processing that reduces the number of analyzers needed while maintaining measurement efficiency.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9158642B2Method of testing multiple data packet signal transceivers concurrently
Publication Date: 2015.10.13 LITEPOINT CORP
  • US9158642B2 patent drawing
  • US9158642B2 patent drawing
  • US9158642B2 patent drawing

AI summary

A method of testing, such as for a bit error rate (BER), of multiple data packet signal transceivers during which a tester and the data packet signal transceivers exchange sequences of test data packets and summary data packets. The tester provides the test data packets which contain respective pluralities of data bits with respective predetermined bit patterns. Responsive thereto, the data packet signal transceivers provide the summary data packets which contain respective summary data indicative of the number of data bits with the respective predetermined bit patterns that are correctly received by corresponding ones of the data packet signal transceivers.