Concurrent Data Valid Window Sampling for IC Testing
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Solution Overview
Problem
Existing methods for testing integrated circuit devices, such as memory devices, face challenges in accurately determining the data valid window due to phase differences and signal degradation, which can lead to incomplete or inaccurate testing results.
Innovation Solution
A system and method that allows for concurrent sampling of multiple points within a data bit region of a response data signal from a memory device, using additional testing components to identify the data valid window without requiring repeated transmissions of test vector patterns, enabling a more efficient and comprehensive analysis of the data valid window characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If repeated transmissions of test vector patterns are used to determine data valid window, then measurement precision is improved, but testing time increases
Solution Approach 1:
The system performs preliminary characterization of the device under test to establish a lookup table of valid window characteristics before actual testing. This preliminary action allows the testing system to use stored reference data rather than repeatedly measuring the same parameters, thereby reducing testing time while maintaining accuracy.
Solution Approach 2:
The invention creates a lookup table that copies and stores pre-determined valid window characteristics from reference measurements. During actual testing, the system queries this copied reference data instead of performing repeated measurements, significantly reducing testing time while preserving measurement precision.
2Measurement precision
If multiple sampling points are tested sequentially, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The system pre-characterizes the device under test and stores the results in a lookup table during setup. This preliminary characterization eliminates the need for complex real-time analysis during actual testing, simplifying the testing system architecture while maintaining comprehensive measurement precision.
Solution Approach 2:
The invention copies valid window characteristics into a lookup table structure, transforming complex real-time measurement problems into simple table queries. This approach reduces the complexity of the testing system by replacing complex sequential sampling with straightforward lookup operations.
3Productivity
If conventional testing methods are used, then ease of operation is maintained, but productivity decreases
Solution Approach 1:
The system copies valid window data into a lookup table that can be quickly queried during testing. This eliminates the need for complex real-time analysis and repeated measurements, significantly improving productivity while keeping the testing procedure simple and easy to operate through straightforward table lookups.
Solution Approach 2:
By performing characterization and creating lookup tables during setup, the system prepares all necessary reference data in advance. This preliminary action makes subsequent testing operations simple and efficient, as the tester only needs to query pre-computed data rather than perform complex real-time measurements.
Data Source
AI summary
Embodiments of a system and method for testing an integrated circuit device are described herein. Testing is complemented by a determination of characteristics of a data valid window that identifies components of a response data signal from a device under test where the data signal can always be expected to be stable. In at least one embodiment, the method comprises: for each individual data bit region of one or more data bit regions of a second data signal, sampling the second data signal at a plurality of points of the individual data bit region to produce a plurality of sampled values for the second data signal; for each sampled value of the plurality of sampled values, determining whether the sampled value matches an expected bit pattern value corresponding to the sampled value; determining one or more characteristics of the data valid window that defines conditions under which a valid sample can be expected to be taken; and outputting a test outcome based on one or more characteristics of the data valid window. In some embodiments, the second data signal may be sampled at the plurality of points of the individual data bit region concurrently. In some embodiments, the determination of whether each sampled value of the plurality of sampled values matches the expected bit pattern value may be performed concurrently for all of the plurality of sampled values.