Conduction Inspection Jig for High-Density PCBs

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Solution Overview

Problem

Existing conduction inspection jigs face challenges in accurately inspecting high-density printed wiring boards with closely spaced electrodes due to limitations in probe density and accuracy, and difficulty in miniaturization and maintaining cleanliness of the inspection space.

Innovation Solution

A conduction inspection jig design featuring a first member, a second member positioned above, and a third member that surrounds the space between them, allowing probes to pass through, which controls the distance and increases contact areas to support the first and second members, enabling high-density inspection with reduced thickness and improved cleanliness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the probe density is increased to inspect high-density printed wiring boards with closely spaced electrodes, then the measurement precision is improved, but the device complexity increases and the size of the inspection jig increases

Engineering Contradiction:
Improveinspection accuracyVSAvoidprobe density
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The inspection jig is divided into a first member and a second member that are separable from each other. The probes are arranged in a matrix pattern between these two members, allowing the system to achieve high probe density without requiring a single complex monolithic structure. This segmentation enables independent optimization of each member's design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The probes are positioned to extend through the space between the first and second members, with the probe array effectively nested within the structural framework formed by the two members. This nested arrangement allows the probes to be densely packed while being supported by the outer structural members, achieving high measurement precision without proportionally increasing overall device complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Volume of moving object

If the distance between the first member and second member is reduced to miniaturize the inspection jig, then the volume of the inspection jig is reduced, but the cleanliness of the inspection space becomes difficult to maintain

Engineering Contradiction:
Improveinspection jig sizeVSAvoidcleanliness of inspection space
Core Design Contradiction:
Volume of moving objectVSObject-affected harmful factors

Solution Approach 1:

A flexible seal member is introduced between the first member and the second member to form a seal at the interface. This seal member creates a clean inspection space while allowing the first and second members to be positioned close together. The sealing structure prevents contamination without requiring excessive spacing, thus enabling miniaturization while maintaining cleanliness.

Inventive Principle:
Principle #30Flexible shells and thin films

3Strength

If the contact area between members is increased to support the structure, then the strength is improved, but the thickness of the members must be increased which increases the overall size

Engineering Contradiction:
Improvestructural supportVSAvoidmember thickness
Core Design Contradiction:
StrengthVSLength of moving object

Solution Approach 1:

The seal member is positioned to extend in the thickness direction of both the first member and the second member, merging the sealing function with the structural support function. This integrated design allows the seal member to contribute to both cleanliness (by sealing) and structural strength (by providing contact area), without requiring additional thickening of the main structural members.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS11789063B2Conduction inspection jig, and inspection method of printed wiring board
Publication Date: 2023.10.17 IBIDEN CO LTD
  • US11789063B2 patent drawing
  • US11789063B2 patent drawing
  • US11789063B2 patent drawing

AI summary

A conduction inspection jig includes a first member having first openings, a second member having second openings and formed to be positioned above the first member, a third member formed to be positioned between the first member and the second member such that the third member forms a space between the first member and the second member and at least substantially surrounds the space, and a probe formed to pass through one of the first openings and one of the second openings such that the probe extends through the space formed between the first member and the second member.