Conductive Elastomer Test Probe for Back-Drilled PCB Holes

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Solution Overview

Problem

Conventional probe testing methods for back-drilled plated through hole via structures in printed circuit boards are costly and complex, and existing solutions fail to effectively make electrical contact with the back-drilled plating layers, leading to signal integrity issues and increased manufacturing complexity.

Innovation Solution

A test probe apparatus with a conductive elastomer tip, formed by spray coating a metal impregnated polymer, is designed to fit within the back-drilled plated through hole, providing a 360-degree contact surface and establishing a conductive path by compressing conductive particles within the elastomer material, which is only conductive when in contact with the plating layer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If conventional probe testing methods are used for back-drilled plated through hole via structures, then the testing can be performed with standard equipment, but the cost and manufacturing complexity increase significantly

Engineering Contradiction:
Improvemanufacturing complexityVSAvoidelectrical contact reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent applies a conductive elastomer coating on the probe tip, which is a flexible material that can deform to conform to the internal geometry of the back-drilled plated through hole. This flexible coating provides reliable electrical contact with the remaining plating layer while keeping the probe structure simple and cost-effective, resolving the contradiction between manufacturing ease and contact reliability

Inventive Principle:
Principle #30Flexible shells and thin films

Solution Approach 2:

The patent uses a composite structure combining a rigid probe body with a flexible conductive elastomer coating. This composite material approach allows the probe to maintain structural integrity while the elastomer layer provides adaptive electrical contact, reducing manufacturing complexity without sacrificing contact reliability

Inventive Principle:
Principle #40Composite materials

2Stability of the object's composition

If the probe tip is made rigid for structural stability, then the probe maintains its shape, but it cannot effectively contact the recessed plating layer in back-drilled holes

Engineering Contradiction:
Improveprobe tip stabilityVSAvoidcontact precision with plating layer
Core Design Contradiction:
Stability of the object's compositionVSManufacturing precision

Solution Approach 1:

The conductive elastomer coating on the probe tip is designed with specific thickness and material properties that allow it to deform and conform to the recessed plating layer geometry. This flexible shell approach maintains overall probe stability while enabling precise contact with the plating layer, resolving the contradiction between structural stability and contact precision

Inventive Principle:
Principle #30Flexible shells and thin films

3Length of moving object

If the probe tip width is reduced to fit within the through-hole, then insertion is enabled, but the contact surface area with the plating layer is insufficient

Engineering Contradiction:
Improveprobe tip widthVSAvoidcontact surface area
Core Design Contradiction:
Length of moving objectVSArea of stationary object

Solution Approach 1:

The patent transitions from a two-dimensional contact approach to a three-dimensional conformal contact by using a flexible elastomer coating that wraps around and conforms to the cylindrical interior surface of the back-drilled hole. This dimensional approach allows the probe tip to remain narrow for insertion while achieving sufficient contact surface area through the conformal 360-degree contact with the plating layer

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Reliability

If the probe tip is made conductive throughout, then electrical contact is established, but surface oxides on the plating layer are not removed, leading to poor contact quality

Engineering Contradiction:
Improveelectrical conductivityVSAvoidsurface oxide interference
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The conductive elastomer coating acts as an intermediary between the probe body and the plating layer. During insertion, this flexible coating mechanically wipes or abrades the surface oxides from the plating layer, creating a clean contact surface. The elastomer then maintains continuous conductive contact, resolving the contradiction between establishing conductivity and removing harmful surface oxides

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables efficient and cost-effective probing of back-drilled plated through holes, allowing for early detection of defects and reducing manufacturing complexity by providing a reliable conductive path without damaging the plating layers, while also removing surface oxides for clean contact.

Implementation Method 1

The conductive elastomer structure may be formed by spray coating the probe tip or distal end region with a conductive elastomer material

Methodology Applied
Scientific EffectSpray coating: Spray

Implementation Method 2

establishing a conductive path by compressing conductive particles within the elastomer material

Methodology Applied
Scientific EffectCompression: Compression

Implementation Method 3

removing surface oxides for clean contact

Methodology Applied
Scientific EffectMechanical wiping: Abrasion

Data Source

PatentUS9459285B2Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly
Publication Date: 2016.10.04 GLOBALFOUNDRIES US INC
  • US9459285B2 patent drawing
  • US9459285B2 patent drawing
  • US9459285B2 patent drawing

AI summary

A test probe is provided for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, where the test probe includes a conductive probe body with a distal tip region extending a predetermined minimum coverage length (LTIP) that is longer than a recess depth dimension (DPL) for a recessed plating layer formed in the back-drilled plated through hole connector with an elastomer test probe tip formed around the distal tip region and having a total tip width (WTIP) which is compressed when inserted into the recessed plating layer formed in a back-drilled plated through hole connector, thereby establishing a conductive path between the conductive probe body and the recessed plating layer.