Conductive Flat Punch for Lateral Force Control in TEM

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Solution Overview

Problem

Existing mechanical test tools for micro- and nano-scale materials struggle to apply lateral displacement or transverse forces accurately, limiting their ability to control friction and other mechanical properties due to inertia-dependent sliding and uniaxial force restrictions.

Innovation Solution

A measurement apparatus using a conductive flat punch within a high-intensity magnetic field, where the punch deflects laterally under electromagnetic force, allowing for controlled transverse force application through current magnitude and frequency adjustments, enabling precise mechanical testing in a transmission electron microscope.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If piezoelectric ceramic controls the sapphire ball to move through inertial sliding design, then three-dimensional movement is enabled, but accurate control for quantitative displacement is unable to be provided

Engineering Contradiction:

Improvethree-dimensional movement capabilityVSAvoiddisplacement control accuracy

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent replaces the mechanical inertial sliding system with an electromagnetic control system. The conductive flat punch is controlled by electromagnetic forces generated by the transmission electron microscope, eliminating the need for mechanical springs and inertial sliding. This substitution enables precise control of lateral displacement while maintaining three-dimensional movement capability, as electromagnetic forces can be accurately modulated without the limitations of mechanical inertia.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If commercial sample holder uses capacitive transducer with three-level control systems, then quantitative force and displacement relation is output, but application in researches on friction requiring two-dimensional force is greatly restricted

Engineering Contradiction:

Improvequantitative force and displacement measurementVSAvoidtwo-dimensional force application capability

Core Design Contradiction:

Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent creates a universal sample holder design that can perform both uniaxial and two-dimensional force applications. The conductive flat punch structure, controlled by electromagnetic forces, can apply forces in multiple directions (vertical and lateral), making it suitable for various mechanical tests including friction research requiring two-dimensional force control, while maintaining the capability for quantitative force and displacement measurement.

Inventive Principle:

Principle #6Universality (Multi-functionality)

3Measurement precision

If feedback control system is used in sample holder, then displacement and force application control is achieved, but lag effect in time on displacement and force application occurs

Engineering Contradiction:

Improvedisplacement and force controlVSAvoidtime lag in force application

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces the mechanical feedback control system with direct electromagnetic control. The conductive flat punch responds directly to electromagnetic forces generated by the transmission electron microscope without mechanical transmission components. This eliminates the time lag associated with mechanical feedback loops, springs, and inertial elements, enabling real-time control of displacement and force application while maintaining measurement precision.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution allows for real-time, precise control of transverse forces during mechanical testing of micro- and nano-scale materials, increasing equipment utilization and reducing experimental costs while enabling accurate measurements of friction, fatigue, and deformation properties.

Implementation Method 1

the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force

Methodology Applied

Scientific EffectElectromagnetic force: Lorentz Force

Data Source

PatentUS10976238B2Measurement apparatus for micro- and nano-scale material and measurement method thereof

Publication Date: 2021.04.13 XI AN JIAOTONG UNIV

AI summary

A measurement apparatus for micro- and nano-scale materials and a measurement method thereof are provided. The measurement apparatus for the micro- and nano-scale material includes a transmission electron microscope to generate a magnetic field, and a conductive flat punch and a sample which are arranged in the magnetic field. The sample includes the micro- and nano-scale materials. When the current passes through the sample and the conductive flat punch, the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force. The required lateral displacement of the present invention is controllable, so that the utilization rate of equipment is greatly increased, and the cost is reduced. In addition, the whole test is performed in the transmission electron microscope, so that a measurement process can be observed in real time.