Conductive Pin Pairs with Inclined Interface for Microcircuit Testing

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Solution Overview

Problem

Microcircuit testing equipment faces challenges in making accurate, non-destructive electrical contact with closely spaced microcircuit contacts, leading to incorrect connections, wear-induced debris contamination, and increased costs due to frequent retesting and replacement of tester contacts.

Innovation Solution

The use of a replaceable, longitudinally compressible membrane with electrically conductive pin pairs held by an interposer membrane, which includes top and bottom contact plates and a vertically resilient non-conductive member, allows for reliable and efficient temporary electrical connections without damaging the microcircuits or tester components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional test contacts are used to make electrical connections with microcircuit terminals, then electrical contact is established, but wear and debris contamination occur leading to poor connections and false defect indications

Engineering Contradiction:

Improveelectrical connection reliabilityVSAvoiddebris contamination

Core Design Contradiction:

ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The invention extracts the harmful wear debris generation by separating the test contact function from the terminal contact function. The compliant member makes initial contact without wearing, while the test contact makes the actual electrical connection, preventing debris generation at the critical interface.

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The compliant member acts as an intermediary between the test contact and the microcircuit terminal. It absorbs wear and deformation, protecting the test contact from direct contact with the terminal, thereby eliminating debris generation while maintaining reliable electrical connection.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Measurement precision

If tester contacts are replaced frequently to maintain testing accuracy, then testing precision is improved, but downtime and operational costs increase

Engineering Contradiction:

Improvetesting accuracyVSAvoiddowntime for contact replacement

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The invention replaces the mechanical wear-based contact system with a compliant member-based system that eliminates wear through material compliance. The compliant member deforms elastically to make contact without generating debris, maintaining testing accuracy over extended periods without replacement.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If tester contacts are replaced frequently to maintain testing accuracy, then false defect indications are reduced, but operational costs increase

Engineering Contradiction:

Improvetesting accuracyVSAvoidoperational costs

Core Design Contradiction:

Measurement precisionVSLoss of energy

Solution Approach 1:

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

4Reliability

If microcircuits are tested before installation, then defective devices are identified, but the testing process itself can cause false defect indications due to connection errors

Engineering Contradiction:

Improvedefect identification accuracyVSAvoidtesting system complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The compliant member acts as an intermediary that ensures reliable electrical connection between the test contact and microcircuit terminal. By eliminating wear and debris generation at this interface, false defect indications are prevented while maintaining simple and reliable testing system operation.

Inventive Principle:

Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables high-throughput testing with reduced wear and debris contamination, minimizing false defect indications and extending the lifespan of test equipment by allowing easy replacement of the interposer membrane, thus lowering overall testing costs and improving accuracy.

Implementation Method 1

a vertically resilient non-conductive member

Methodology Applied

Scientific EffectElasticity: Elasticity

Data Source

PatentEP2407013B1Electrically conductive pins for microcircuit tester

Publication Date: 2021.12.22 JOHNSTECH INTERNATIONAL CORP

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AI summary

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.