Conductive Chemical Compound Resistors in Semiconductor Devices

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Solution Overview

Problem

Advanced metal gate processes in semiconductor device manufacturing require additional lithography masks and implantation steps to form polysilicon resistors, increasing manufacturing costs and complexity.

Innovation Solution

Formation of resistors using a conductive chemical compound material, such as TiN, TaN, or WN, in a middle-of-line (MEOL) or back-end-of-line (BEOL) process, which allows for the creation of high-precision resistors with reduced process flow impact and simplified manufacturing by using only one additional lithography mask and process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If polysilicon resistors are formed in advanced metal gate processes, then resistance can be achieved, but additional lithography masks and implantation steps are required, increasing manufacturing complexity and costs

Engineering Contradiction:
Improveresistor formation precisionVSAvoidmanufacturing process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent changes the material parameter from polysilicon to conductive chemical compound materials (such as TiN, TaN, WN), which fundamentally alters the formation process. This material substitution eliminates the need for additional lithography masks and implantation steps, resolving the contradiction between achieving precise resistor formation and maintaining manufacturing simplicity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs conductive chemical compound materials that can be deposited using standard PVD or CVD processes already present in the fabrication line. These materials serve as disposable resistive elements that don't require complex protection schemes or additional processing steps, reducing overall manufacturing complexity while maintaining precision

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

2Manufacturing precision

If polysilicon resistors are formed with additional lithography masks and implantation steps, then resistance can be lowered, but manufacturing costs increase

Engineering Contradiction:
Improveresistor resistance controlVSAvoidmanufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent changes the material parameter from polysilicon to conductive chemical compound materials, which can be deposited using standard PVD or CVD processes. This eliminates the need for expensive additional lithography masks and implantation steps, thereby reducing manufacturing costs while maintaining precise resistance control through material composition and geometry

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The conductive chemical compound materials serve multiple functions: they provide the resistive element, can be deposited using existing standard processes, and eliminate the need for separate protection and implantation steps. This multi-functionality reduces both cost and complexity compared to polysilicon-based approaches

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the production of high-precision resistors with resistance comparable to polysilicon resistors, simplifying manufacturing, reducing costs, and minimizing process steps while maintaining flexibility and low wafer 3-sigma variation.

Implementation Method 1

forming a conductive chemical compound material over the first insulating material

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Implementation Method 2

forming a conductive chemical compound material over the first insulating material

Methodology Applied
Scientific EffectChemical Vapour Deposition: Chemical Vapour Deposition

Implementation Method 3

filling the patterned second insulating material with a conductive material to form a first contact

Methodology Applied
Scientific EffectElectroplating: Electroplating

Implementation Method 4

filling the patterned second insulating material with a conductive material to form a first contact

Methodology Applied
Scientific EffectElectrodeposition: Electrodeposition

Data Source

PatentUS9111768B2Semiconductor devices, methods of manufacture thereof, and methods of forming resistors
Publication Date: 2015.08.18 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9111768B2 patent drawing
  • US9111768B2 patent drawing
  • US9111768B2 patent drawing

AI summary

Semiconductor devices, methods of manufacture thereof, and methods of forming resistors are disclosed. In one embodiment, a method of manufacturing a semiconductor device includes forming a first insulating material over a workpiece, and forming a conductive chemical compound material over the first insulating material. The conductive chemical compound material is patterned to form a resistor. A second insulating material is formed over the resistor, and the second insulating material is patterned. The patterned second insulating material is filled with a conductive material to form a first contact coupled to a first end of the resistor and to form a second contact coupled to a second end of the resistor.