Conductive Structure Layouts with Stair-Step Cut Patterns

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Solution Overview

Problem

Conductive structures in semiconductor devices face challenges with short circuits due to close spacing and long lengths, which limit available routes and connection points, increasing impedance.

Innovation Solution

The layout of conductive structures with 'stair-step' cut patterns in multiple layers allows for more routes and connection points, reducing impedance by limiting the length of conductive structures and preventing short circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If conductive structures are placed close together to save space, then area utilization is improved, but the risk of short circuits increases

Engineering Contradiction:
Improvearea utilizationVSAvoidrisk of short circuits
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The conductive structures are divided into multiple segments with gaps between them, forming a discontinuous pattern. This segmentation reduces the risk of short circuits while maintaining space efficiency, as the gaps act as isolation barriers between adjacent conductive segments.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Dielectric material is introduced as an intermediary substance between adjacent conductive structures. This dielectric layer provides electrical isolation and prevents short circuits while allowing the conductive structures to be placed in close proximity for efficient space utilization.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If long conductive structures are used to connect components, then connectivity is improved, but impedance increases

Engineering Contradiction:
ImproveconnectivityVSAvoidimpedance
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

Long conductive structures are divided into multiple shorter segments arranged in a stepped or discontinuous pattern. This segmentation reduces the total length of continuous conductive paths, thereby lowering impedance while maintaining connectivity between components through multiple connection points.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The conductive structures transition from simple linear paths to multi-dimensional stepped patterns across different layers. This dimensional change allows for shorter individual segment lengths while achieving the same overall connectivity, reducing impedance without sacrificing ease of connection.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Area of stationary object

If conductive structures extend long distances across the device, then connectivity coverage is improved, but the risk of short circuits increases

Engineering Contradiction:
Improveconnectivity coverageVSAvoidrisk of short circuits
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

Long-distance conductive structures are segmented into multiple shorter sections with gaps or dielectric isolation between them. This maintains broad connectivity coverage across the device while reducing the risk of short circuits by breaking up continuous conductive paths that could inadvertently contact.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Conductive structures utilize multiple layers and three-dimensional routing to achieve broad connectivity coverage. By distributing conductive segments across different vertical layers and using stepped patterns, the design covers large device areas while keeping individual segment lengths short and isolated.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11646271B2Apparatuses including conductive structure layouts
Publication Date: 2023.05.09 MICRON TECHNOLOGY INC
  • US11646271B2 patent drawing
  • US11646271B2 patent drawing
  • US11646271B2 patent drawing

AI summary

Embodiments of the disclosure are drawn to arrangements of one or more “cuts” or pattern of cuts in conductive structures. Wiring layers may each include a cut pattern including a set of cuts through conductive structures of the wiring layers where each of the cuts is offset from the other in a direction orthogonal to the cut. The cut pattern in a wiring layer may be orthogonal to the cut pattern in another wiring layer. In some examples, the cut pattern may be a stair-step pattern. In some examples, the cut pattern may be interrupted by other conductive structures.