Configurable Analog Front-End Circuit for Multi-Sensor Development
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Solution Overview
Problem
The conventional technology faces challenges in developing semiconductor devices with analog front-end circuits quickly and efficiently to accommodate various sensors, such as temperature, infrared, and impact sensors, due to the need for custom designs that match specific sensor principles and characteristics.
Innovation Solution
A development support apparatus and method that includes a GUI for displaying and setting up the circuit configuration and characteristics of an analog front-end unit, allowing users to intuitively change the circuit configuration and characteristics, thereby facilitating the development of semiconductor devices for different sensors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If custom AFE circuit designs are created for each sensor type, then the circuit characteristic matches the sensor principle, but the development time increases and productivity decreases
Solution Approach 1:
The patent implements a universal AFE circuit design that can be configured to support multiple sensor types through a single integrated circuit. The circuit includes configurable components such as adjustable gain amplifiers, programmable filters, and selectable A/D converter settings that can be adapted to match different sensor characteristics without requiring custom circuit designs for each sensor type.
Solution Approach 2:
The patent employs parameter change mechanisms where circuit characteristics such as gain, bandwidth, and filtering parameters can be dynamically adjusted based on the connected sensor type. This allows the same physical circuit to be reconfigured for different sensor principles (e.g., temperature, infrared, impact sensors) by changing electrical parameters rather than redesigning the circuit.
2Adaptability or versatility
If various circuit configurations are prepared for different sensors, then each sensor can be optimally supported, but the device complexity increases
Solution Approach 1:
The patent employs a universal AFE circuit architecture that consolidates multiple sensor-specific circuit configurations into a single integrated circuit. The circuit includes configurable components such as adjustable gain amplifiers, programmable filters, and selectable A/D converter settings that can be adapted to match different sensor characteristics without requiring separate physical circuits for each sensor type.
Solution Approach 2:
The patent implements dynamic reconfiguration capabilities where the circuit can change its characteristics in real-time based on the connected sensor type. Control logic automatically adjusts amplifier gain, filter bandwidth, and converter parameters dynamically, allowing the circuit to adapt to different sensor principles without manual reconfiguration or physical changes to the circuit topology.
3Reliability
If exclusive AFE circuits are developed for specific sensors, then the circuit performance is optimized, but the development cost and time increase
Solution Approach 1:
The patent implements a universal AFE circuit design that can be configured to support multiple sensor types through a single integrated circuit. The circuit includes configurable components such as adjustable gain amplifiers, programmable filters, and selectable A/D converter settings that can be adapted to match different sensor characteristics without requiring custom circuit designs for each sensor type.
Solution Approach 2:
The patent incorporates pre-configured circuit templates and default parameter sets for common sensor types within the AFE circuit design. This preliminary preparation allows developers to quickly select and activate appropriate configurations without performing full custom design procedures, thereby reducing development time while maintaining optimized performance for each sensor type.
Data Source
AI summary
Disclosed is a development support apparatus of a semiconductor device that makes it possible to easily develop the semiconductor device, a development support method, and a program product. A design evaluation apparatus is a design evaluation apparatus having an analog front-end unit for inputting a measurement signal of a sensor and an MCU unit, which has a GUI processing unit for displaying a GUI corresponding to a circuit configuration of the analog front-end unit and a register setting unit that generates setting information for setting up the circuit configuration and a circuit characteristic of the analog front-end unit based on an operation of the GUI by a user, and sets the generated setting information in the analog front-end unit through the MCU unit.