Configurable Bandgap Reference Circuit for Wide-Range Temperature Sensing
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Solution Overview
Problem
Temperature detection circuits using analog bandgap reference (BGR) circuits face limitations in precision and power supply rejection ratio (PSRR) over a wide temperature range, particularly at lower voltage levels, leading to reduced detection accuracy and PSRR deterioration.
Innovation Solution
The semiconductor integrated circuit incorporates a bandgap reference circuit with a first and second bandgap element, a current mirror circuit, and a setting control circuit to generate temperature-dependent and independent voltages, optimizing settings based on temperature information to enhance precision and PSRR across a broad temperature range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an analog BGR circuit with ADC is used for temperature detection, then temperature detection capability is achieved, but detection precision deteriorates at lower voltage levels and over wide temperature ranges
Solution Approach 1:
The patent applies dynamics by making the bandgap reference circuit configurable through multiple setting combinations. The circuit can dynamically switch between different configuration states (first setting combination for first temperature range, second setting combination for second temperature range) to optimize performance across varying temperature conditions, resolving the contradiction between maintaining precision across wide temperature ranges.
Solution Approach 2:
The patent changes circuit parameters by providing multiple setting combinations for the bandgap reference circuit. Each setting combination corresponds to different parameter configurations that optimize the circuit's temperature detection precision for specific temperature ranges. The setting control circuit adjusts these parameters based on detected temperature, thereby maintaining high precision across wide temperature variations.
2Use of energy by moving object
If voltage of the temperature detection circuit is lowered, then power consumption is reduced, but detection accuracy deteriorates and PSRR is worsened
Solution Approach 1:
The patent applies dynamics by enabling the bandgap reference circuit to switch between different setting combinations based on operating conditions. When voltage is lowered to reduce power consumption, the circuit can transition to an optimized setting combination that maintains detection accuracy and PSRR performance, thus resolving the contradiction between low power consumption and high detection accuracy.
Solution Approach 2:
The patent changes the operational parameters of the bandgap reference circuit through multiple setting combinations. These parameter changes allow the circuit to maintain optimal detection accuracy and PSRR characteristics even when operating at lower voltage levels, thereby reducing power consumption without sacrificing performance.
3Measurement precision
If a fixed configuration bandgap reference circuit is used, then circuit simplicity is maintained, but detection precision deteriorates over wide temperature ranges
Solution Approach 1:
The patent introduces dynamic configurability to the bandgap reference circuit through a setting control circuit that switches between different setting combinations based on temperature ranges. This dynamic approach maintains high detection precision across wide temperature ranges while adding only minimal circuit complexity for control and switching functions.
Solution Approach 2:
The patent makes the bandgap reference circuit multi-functional by designing it to operate in multiple setting combinations, each optimized for different temperature ranges. This universal design allows a single circuit to serve multiple temperature detection purposes with high precision, avoiding the need for separate fixed-configuration circuits for different temperature ranges.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables high-precision temperature detection and improved PSRR over a wide temperature range, ensuring accurate temperature measurement and power supply rejection, even at lower voltage levels.
Implementation Method 1
a bandgap reference circuit that includes a first bandgap element, a second bandgap element, and a current mirror circuit and that generates a temperature-dependent first voltage and a temperature-independent reference voltage
Data Source
AI summary
A semiconductor integrated circuit includes a bandgap reference circuit that includes a first bandgap element, a second bandgap element, and a current mirror circuit. The bandgap reference circuit is configured to generate a temperature-dependent first voltage and a temperature-independent reference voltage. The semiconductor integrated circuit includes an analog-to-digital converter configured to convert the first voltage into an output code based on the reference voltage and output the first voltage as temperature information, and a setting control circuit configured to change at least one setting of the bandgap reference circuit based on the temperature information.