Configurable Cell Oscillator Test Mode for IC Performance Measurement
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Solution Overview
Problem
Existing integrated circuit testing methods fail to accurately assess the performance and current consumption of functional blocks, as they either lack precision or require significant silicon surface area and are costly, limiting their application to prototypes rather than definitive circuits.
Innovation Solution
Incorporating a test mode in integrated circuits where configurable cells are coupled by their propagation input and output to form an oscillating loop, allowing for the measurement of performance and consumption without additional test circuits, thereby enabling efficient performance testing with minimal silicon usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If test circuits are added to measure performance of functional blocks, then measurement precision is improved, but device complexity and silicon surface area increase significantly
Solution Approach 1:
The functional blocks themselves are used to generate the test signal through feedback connection, eliminating the need for external test circuits. The blocks serve both their functional purpose and their own testing, reducing overall device complexity while maintaining measurement capability
Solution Approach 2:
The feedback loop configuration allows the same functional blocks to serve dual purposes: performing their intended logic functions during normal operation and simultaneously acting as oscillators for performance testing when configured in the test mode, thereby avoiding additional dedicated test circuits
2Measurement precision
If test circuits are added to measure performance of functional blocks, then measurement precision is improved, but silicon surface area increases
Solution Approach 1:
The functional blocks test themselves by forming oscillators through feedback connections to their own outputs, eliminating the need for separate test circuitry that would consume additional silicon surface area
Solution Approach 2:
The testing function is merged with the existing functional blocks by configuring them in a feedback loop, combining the measurement capability with the functional elements already present on the chip rather than adding separate test structures
3Reliability
If traditional test methods are used, then functional blocks can be tested, but current consumption cannot be accurately measured
Solution Approach 1:
The functional blocks measure their own current consumption by operating as oscillators, where the oscillation characteristics directly reflect the actual current draw of the blocks under test conditions, providing accurate measurement without external test equipment
4Adaptability or versatility
If configurable cells are coupled in functional mode, then logic circuits are formed, but performance testing capability is lost
Solution Approach 1:
The configurable cells can dynamically switch between functional mode and test mode through reconfiguration of their connections, allowing the circuit to adapt its topology based on whether performance testing or normal operation is required
Solution Approach 2:
The same configurable cells and logic blocks serve multiple functions: forming logic circuits during normal operation and forming oscillators for performance testing when reconfigured, maintaining adaptability while enabling measurement capability
Data Source
AI summary
An integrated circuit includes N configurable cells each including one functional input, one output, one propagation input and one output. The circuit includes a functional mode in which the N configurable cells are coupled by their functional input and their output to logic blocks with which they cooperate to form at least one logic circuit. The disclosed circuit also includes a test mode in which the N configurable cells are coupled by their propagation input and their output to the logic blocks and in which the output of the Nth configurable cell is coupled to a functional input of the first logic block to form an oscillator.