Configurable Storage Network Tester Simulating Multiple Protocols

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Solution Overview

Problem

Current storage network testing is inefficient due to the need for different manufacturers to use separate test devices, leading to high costs and complexity, especially when testing encapsulated physical storage devices, which requires breaking encapsulation and potentially damaging the devices during extreme testing.

Innovation Solution

A configurable tester with multiple operation modes that can simulate various objects within a storage network, allowing a single device to test different components using protocols like SAS, FC, and SATA, reducing the need for multiple test devices and minimizing physical storage device usage during testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If different manufacturers use separate test devices for their respective products in a storage network, then each manufacturer can test their products independently during research and development, but the overall testing efficiency decreases and costs increase when organizing devices into a storage network

Engineering Contradiction:
Improveproduct testing capabilityVSAvoidtesting efficiency
Core Design Contradiction:
Adaptability or versatilityVSProductivity

Solution Approach 1:

The test device is designed with multiple operation modes that allow it to function as different types of storage devices (RAID 0, RAID 1, RAID 5, etc.) and simulate various storage network components. This multi-functionality enables a single test device to replace multiple manufacturer-specific test devices, thereby improving testing efficiency while maintaining the ability to test different products independently

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If multiple test devices are used to test different components in a storage network, then each component can be tested with specialized equipment, but the device complexity and cost increase

Engineering Contradiction:
Improvecomponent testing accuracyVSAvoidnumber of test devices
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The test device incorporates multiple operation modes that enable it to simulate different storage devices and protocols (SAS, FC, SATA) within a single unified platform. This approach maintains component testing accuracy while reducing the overall number of test devices required in the storage network testing setup

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If physical storage devices are used for extreme testing, then comprehensive performance validation can be achieved, but the risk of damaging the devices increases

Engineering Contradiction:
Improveperformance validationVSAvoiddevice damage risk
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The test device creates virtual copies of physical storage devices through simulation modes. Instead of subjecting actual physical storage devices to extreme testing conditions that may cause damage, the system uses simulated storage devices that replicate the same testing scenarios without the risk of physical damage to valuable hardware

Inventive Principle:
Principle #26Copying

Data Source

PatentUS10204702B2Testing a storage network
Publication Date: 2019.02.12 EMC IP HLDG CO LLC
  • US10204702B2 patent drawing
  • US10204702B2 patent drawing
  • US10204702B2 patent drawing

AI summary

Embodiments of the present disclosure provide an apparatus for testing a storage network comprising a processor configured to generate a configuration signal in response to a test request; and a tester coupled to the processor and configured to, by the configuration signal, operate under different operation modes so as to test different to-be-tested objects in the storage network. The test request indicates an operation mode of the tester, wherein various types of to-be-tested objects in a storage network can be tested by one test device, at a low test cost and with more convenient operations.