Configurable Semiconductor Test System Using Rewritable Memory
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Solution Overview
Problem
Conventional semiconductor test apparatuses are inflexible, costly, and require dedicated hardware for each device type and test item, limiting their application in design and development phases, and are not easily adaptable to new test requirements.
Innovation Solution
A test system comprising a server, a versatile tester hardware with rewritable memory, and an information processing apparatus that allows configuration data to be easily selected and written, enabling the system to support various devices and tests without the need for dedicated hardware, and providing a user-friendly interface for selecting and managing configuration data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If dedicated hardware is used for each device type and test item, then testing reliability is improved, but device complexity and cost increase
Solution Approach 1:
The patent implements a universal test apparatus that can test multiple device types (semiconductor devices, discrete devices, modules) and multiple test items (functional verification tests, DC tests) using a single hardware platform. The system achieves this through configurable software and test algorithms that adapt the apparatus functionality based on the target device and test requirements, eliminating the need for dedicated hardware for each device type while maintaining comprehensive testing capabilities.
2Measurement precision
If dedicated hardware is purchased for each test item, then measurement precision is improved, but loss of substance (cost) increases
Solution Approach 1:
The test apparatus provides a unified platform that delivers precise measurements across multiple test items without requiring separate hardware purchases. The system achieves this through configurable test algorithms and software that optimize the testing process for each specific measurement type (functional verification, DC characteristics, etc.), maintaining measurement precision while eliminating the need to purchase additional hardware for each test item.
Solution Approach 2:
The system changes operational parameters and test configurations based on the specific test item being performed. By dynamically adjusting test algorithms, measurement parameters, and apparatus settings according to the device type and test requirements, the system maintains high measurement precision across diverse test scenarios without requiring dedicated hardware for each parameter set.
3Ease of operation
If conventional test apparatus is used, then ease of operation is improved for standard tests, but adaptability worsens for new test requirements
Solution Approach 1:
The test apparatus implements dynamic configurability through software and test algorithms that can be modified and updated without changing the hardware architecture. The system dynamically adapts to new device types and test requirements by loading appropriate test algorithms and configuring parameters through software, maintaining ease of operation while significantly improving adaptability to new test scenarios.
Solution Approach 2:
The system achieves adaptability through parameter changes in test algorithms and configuration data rather than hardware modifications. By allowing software-based reconfiguration of test parameters, patterns, and sequences, the apparatus can easily adapt to new test requirements while maintaining the user-friendly interface and operational simplicity of the original design.
4Adaptability or versatility
If additional hardware component is mounted for new test item, then adaptability is improved, but device complexity and cost increase
Solution Approach 1:
The patent replaces the mechanical approach of mounting additional hardware components with a software-based configuration system. Instead of physically modifying the apparatus to add new test capabilities, the system uses configurable test algorithms and software parameters to enable new test items, thereby improving adaptability while avoiding increases in hardware complexity.
Data Source
AI summary
A server stores multiple configuration data which respectively provide different functions to a test system. A tester hardware is configured to be capable of changing at least a part of its functions according to the configuration data stored in nonvolatile memory included in the tester hardware. A control program is installed on an information processing apparatus. The control program provides the information processing apparatus with (i) a function of displaying multiple configuration data candidates on a display when the test system is set up, and (ii) a function of writing the configuration data selected by the user to the nonvolatile memory of the tester hardware.