Confocal Microscope Pinhole Control for Faster Sample Search
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Solution Overview
Problem
Conventional confocal microscopes require manual and time-consuming operations to find a suitable sample region for imaging, especially in fluorescence microscopy, due to the need for precise alignment of the focal plane with fluorescent spots, which prolongs the image update time and exposes samples to prolonged illumination.
Innovation Solution
A control device for a confocal microscope that adjusts the aperture of the detection pinhole using a processor-controlled actuator, allowing for increased detection depth and reduced confocality to accelerate the search for suitable target regions by enlarging the depth of detection, supported by a search supporting mode that adjusts pinhole aperture based on user operations and image data evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the aperture of the detection pinhole is kept small to maintain high confocality and precise focal plane alignment, then measurement precision is improved, but the depth of detection is reduced and the time to find suitable sample regions increases
Solution Approach 1:
The patent applies dynamics by making the pinhole aperture adjustable rather than fixed. The system dynamically changes the aperture size based on the operational phase: small aperture during imaging for precision, large aperture during search for speed. This is implemented through a control device that automatically adjusts the aperture in response to user operations or image quality assessment, resolving the contradiction between precision and time consumption.
Solution Approach 2:
The patent changes the physical parameter of pinhole aperture size to resolve the contradiction. By varying this parameter between two states (small for precision imaging, large for rapid scanning), the system achieves both high measurement precision when needed and fast sample region identification when searching, eliminating the need to permanently compromise either requirement.
2Productivity
If the aperture of the detection pinhole is increased to enlarge the depth of detection and accelerate sample region search, then productivity is improved, but measurement precision and confocality are reduced
Solution Approach 1:
The system dynamically adjusts the pinhole aperture size based on operational requirements. During the search phase, the aperture is enlarged to increase depth of detection and accelerate finding suitable regions. During the imaging phase, the aperture is reduced to restore measurement precision. This temporal separation of functions resolves the contradiction between productivity and precision.
Solution Approach 2:
The patent implements periodic switching between two aperture states: a large aperture state for rapid scanning and sample region identification, followed by a small aperture state for precise imaging. This periodic action allows the system to alternate between high productivity and high precision modes, achieving both goals sequentially rather than requiring a compromise in either.
3Ease of operation
If manual operation is used to find sample regions while observing image updates, then ease of operation is maintained, but the time consumption increases due to slow image updates in confocal microscopy
Solution Approach 1:
The patent implements self-service by enabling the system to automatically perform the sample region search function. The control device autonomously adjusts the pinhole aperture and guides the scanning process based on image quality assessment or user-defined criteria, eliminating the tedious manual searching process while preserving manual control capability when needed. This resolves the time consumption issue without completely removing user agency.
Solution Approach 2:
The system uses feedback mechanisms to automatically assess image quality and guide the search for suitable sample regions. By continuously monitoring imaging parameters and providing feedback to the control device, the system can automatically identify optimal regions without requiring manual observation and adjustment, significantly reducing time consumption while maintaining ease of operation through automated decision-making.
Data Source
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AI summary
A control device (148) for a microscope (100) comprises an operating device (132) configured to be operated by a user to vary focusing and/or positioning of an optical imaging system (112) of the microscope (100) relative to a sample (102), an actuator an actuator (140) configured to adjust an aperture (126) of a detection pinhole (124) which is included in the microscope (100) for eliminating out-of-focus light from detection light (116) which is directed by the optical imaging system (112) onto a detector (114) of the microscope (100), and a processor (104) configured to detect a predetermined operating condition in response to a user operation of the operating device (132) and to control the actuator (140) to vary, in particular to increase the aperture (126) of the detection pinhole (124) upon detection of the predetermined operating condition.