Confocal Thickness Measurement for Moving Superconducting Wire
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Solution Overview
Problem
Existing methods for measuring the thickness of thin materials, such as thin films and high-temperature superconducting wires, are limited by the inability to continuously measure thickness distributions in both lengthwise and widthwise directions, leading to low precision and increased error in product design and manufacturing.
Innovation Solution
An apparatus and method utilizing upper and lower confocal sensors disposed on the same axis, synchronized with a thin material's movement, enabling continuous thickness measurement through intermittent, lengthwise, and meandering scan lines, with real-time monitoring and data storage, and compensating deposition processes to achieve uniform thickness distributions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional polarization scheme with multiple sensors is used to measure different materials, then measurement capability for different materials is improved, but device complexity and difficulty in measuring overall thickness distribution increase
Solution Approach 1:
The confocal sensor system is designed to measure thickness of different materials (buffer layer, superconducting layer, protective layer, stabilization layer) using a single universal sensor type. The sensor can detect thickness variations across multiple functional layers without requiring material-specific sensor configurations, thereby reducing device complexity while maintaining versatility.
Solution Approach 2:
The system transitions from measuring only at discrete points to continuous two-dimensional thickness distribution measurement by combining widthwise scanning capability with lengthwise continuous measurement. This dimensional expansion allows comprehensive mapping of thickness variations across the entire thin material surface, enabling detection of overall thickness distribution that was previously difficult to achieve.
2Device complexity
If intermittent thickness measurement is performed, then device complexity is reduced, but measurement precision and ability to detect thickness distribution decrease
Solution Approach 1:
The system implements continuous thickness measurement during the reel-to-reel manufacturing process rather than intermittent measurements. The confocal sensor continuously tracks thickness variations as the thin material passes through, enabling real-time detection of thickness distributions in both widthwise and lengthwise directions, thereby significantly improving measurement precision without excessive complexity.
Solution Approach 2:
The measurement system is designed to dynamically adapt to the moving thin material, with the confocal sensor capable of scanning in the widthwise direction while the material moves in the lengthwise direction. This dynamic measurement capability allows the system to capture two-dimensional thickness distributions during continuous production, maintaining simplicity while achieving high measurement precision.
3Device complexity
If thickness measurement is performed without real-time feedback, then device complexity is reduced, but manufacturing precision and ability to compensate thickness deviations decrease
Solution Approach 1:
The system incorporates real-time feedback by continuously measuring thickness distribution during the deposition process and providing this information back to the manufacturing system. This feedback mechanism enables immediate detection of thickness deviations and allows for real-time compensation adjustments, thereby improving manufacturing precision and thickness uniformity without requiring overly complex control systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables continuous measurement of thin material thickness in both directions, ensuring uniformity and preventing inter-turn contact failures and deformation in high-temperature superconducting wires by compensating for thickness deviations during manufacturing.
Implementation Method 1
an upper confocal sensor provided on the upper slider, and radiating light toward the thin material; and a lower confocal sensor provided on the lower slider, and radiating light toward the thin material
Implementation Method 2
height measurement is performed by receiving light only at a moment when a focus coincides at a measurement position
Data Source
AI summary
An apparatus for continuously measuring the thickness of a thin material includes a main frame configured by upper and lower frames provided in a direction crossing with a movement direction of a thin material and a vertical frame which connects the upper and lower frames, upper and lower sliders moved by sliding along guide grooves formed in the upper and lower frames; an upper confocal sensor radiating light toward the thin material, and a lower confocal sensor radiating light toward the thin material, wherein the upper and lower confocal sensors are disposed on the same axis, and height measurement is performed by receiving light only at a moment when a focus coincides at a measurement position, and wherein the upper confocal sensor and the upper slider and the lower confocal sensor and the lower slider are synchronously controlled, and are controlled in conjunction with movement of the thin material.