Interferometer with Conjugate Area Light Source for Scattering Surfaces
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional interferometers are limited in measuring surface shapes with large differences between the examined and reference surfaces, and struggle to measure scattering surfaces due to non-conjugate relations between light sources and objects, leading to inadequate fringe contrast and measurement accuracy.
Innovation Solution
An interferometer with an area light source of low spatial coherence, arranged in an optically conjugate relation with the examined object, using a rotating diffuser plate and micro lens arrays to form interference fringes between measurement and reference light, allowing for accurate determination of surface shape differences across micro regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a point light source is used in conventional interferometers, then the interferometer structure is simple, but the examined surface and light source are not optically conjugate, limiting the measurement range for surfaces with large curvature differences
Solution Approach 1:
The invention divides the point light source into multiple discrete point sources arranged in a specific pattern. This segmentation allows each point source to independently illuminate corresponding regions on the examined surface, establishing optical conjugacy while maintaining the ability to measure surfaces with large curvature differences across the entire field of view.
Solution Approach 2:
The invention transitions from a single-point light source to a multi-point light source arrangement, adding a spatial dimension to the illumination system. This dimensional change enables simultaneous conjugate illumination of multiple regions on the examined surface, expanding the measurement range without significantly increasing system complexity.
2Area of stationary object
If an area light source is used in conventional interferometers, then the illumination coverage is improved, but the light sources and examined object are not conjugate, resulting in poor fringe contrast for scattering surfaces
Solution Approach 1:
The invention segments the area light source into multiple discrete, spatially separated point sources. This segmentation maintains the extended illumination coverage of an area source while ensuring that each point source is optically conjugate to its corresponding region on the examined surface, thereby improving fringe contrast for scattering surfaces.
Solution Approach 2:
The invention applies local quality by ensuring that each point source in the array is conjugate to its corresponding local region on the examined surface. This local conjugacy relationship improves the fringe contrast and measurement precision for scattering surfaces while maintaining overall illumination coverage through the multi-point arrangement.
3Measurement precision
If the aperture of light receiving elements is reduced to improve fringe contrast detection, then the fringe contrast is improved, but the quantity of light received becomes insufficient
Solution Approach 1:
The invention segments the illumination into multiple discrete point sources, each contributing to the fringe pattern. This segmentation allows the use of smaller aperture light receiving elements for each individual point source while maintaining sufficient total light quantity through the combined contribution of multiple point sources, thereby improving fringe contrast detection without sacrificing light quantity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise measurement of surface shapes with large curvature differences and scattering surfaces by improving fringe contrast and accuracy, allowing for effective surface shape determination across required regions.
Implementation Method 1
interference fringes are formed by interference between measurement light emitted from each small illuminant and reflected on each micro region of the examined surface and reference light emitted from the same small illuminant and reflected on a corresponding micro region of a reference surface
Implementation Method 2
a light-guiding optical system configured to arrange the area light source and the examined object in an optically conjugate relation with each other
Data Source
AI summary
Interferometers are provided for measuring the surface shape of an examined object or a transmitted wavefront through the examined object. An exemplary interferometer includes an area light source having a low spatial coherence property, and a light-guiding optical system configured to arrange the area light source and the examined object in an optically conjugate relation with each other.


