Custom-Geometry Contact Probe for Dense Semiconductor Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing contact probes and testing heads for probe cards are not optimally adaptable to different semiconductor configurations, leading to varying test performances and suboptimal contact pressure and geometric control under load.
Innovation Solution
A contact probe with customized geometry, featuring a central body with varying cross-sectional areas and configurations, optimized dimensions, and an abutment element for precise insertion and pressure control, allowing simplified assembly and efficient testing across diverse semiconductor boards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a substantially vertical probe configuration is used to incorporate a high number of probes per unit area, then the density of probes increases, but the adaptability to different semiconductor configurations decreases
Solution Approach 1:
The probe structure is segmented into distinct functional zones: a first end with a first contact tip for semiconductor contact, a second end with a second contact tip for probe card contact, and a central body extending between them. This segmentation allows each zone to be optimized independently for its specific function while maintaining overall probe density.
Solution Approach 2:
Different portions of the probe have different cross-sectional areas: the central body has a smaller cross-sectional area than both the first end and the second end. This local variation in geometry allows the probe to maintain high density while adapting to different semiconductor configurations through controlled deformation characteristics in specific regions.
2Manufacturing precision
If the probe cross-sectional area is reduced to achieve reduced pitches, then the contact pressure increases, but the structural robustness decreases
Solution Approach 1:
The probe exhibits local quality through varying cross-sectional areas along its length. The central body has a smaller cross-sectional area than the first end and second end, creating regions of different mechanical properties. This allows the probe to achieve reduced pitch capability where needed while maintaining structural robustness at the contact tips through larger cross-sectional areas.
Solution Approach 2:
The probe design transitions from a uniform one-dimensional structure to a three-dimensional structure with varying cross-sectional areas. This dimensional complexity allows simultaneous optimization of pitch (lateral dimension) and structural strength (overall geometry) by controlling the distribution of material along the probe's length.
3Reliability
If the probe geometry is customized for optimal contact pressure, then the test performance improves, but the device complexity increases
Solution Approach 1:
The probe is divided into three main segments: a first end with a first contact tip, a second end with a second contact tip, and a central body. This segmentation allows customization of contact pressure characteristics while maintaining a relatively simple overall structure that is easy to manufacture and maintain.
Solution Approach 2:
The probe has different cross-sectional areas at different locations: the central body has a smaller cross-sectional area than the first end and second end. This local variation optimizes contact pressure distribution for improved test performance while keeping the structure simple enough for practical manufacturing and maintenance.
4Ease of operation
If the probe has axial mobility through guide holes to withstand compression, then the ability to remove and replace probes improves, but the control of geometric configuration under load decreases
Solution Approach 1:
The probe structure with distinct ends and a central body allows controlled deformation under compression loads. The varying cross-sectional areas create predictable stress distribution patterns that maintain geometric configuration control even while allowing axial mobility through the guide holes for ease of replacement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The customized probe geometry ensures optimal contact pressure, reduced pitch capabilities, and efficient testing performance while maintaining robustness and ease of maintenance, adapting to various semiconductor configurations.
Implementation Method 1
The holes of the respective plates through which a certain probe passes are generally slightly offset so that each probe is axially mobile through the respective housing holes, but with some friction which, along with the inherent flexibility of the probes themselves, confers a certain overall ability to withstand compression to the testing head assembly, as if it were slightly cushioned.
Data Source
Figure 1
Figure 2
Figure 3~3B
AI summary
Contact probe (1) comprising a first end (6) having a first contact tip (7) adapted to contact an electronic component under test, a second end (8) having a second contact tip (9) adapted to contact a probe card, and a central body (17) which extends between said first end (6) and said second end (8), a cross-sectional area at said central body (17) being smaller than a cross-sectional area at said first end (6) and a cross-sectional area at said second end (8), wherein said central body (17) provides at least one portion with a rectilinear configuration (18), which develops along a longitudinal axis (x), and at least one portion with a curvilinear configuration (19), which moves away from said longitudinal axis (x), and wherein an extension, measured along the longitudinal axis (x), of a first longitudinal section (D) comprising said second end (8) and said portion with a rectilinear configuration (18) and an extension, measured along the longitudinal axis (x), of a second longitudinal section (L) comprising said second end (8) and said central body (17) are sized so that a reciprocal ratio (D/L) between the extension of the first longitudinal section (D) and the extension of the second longitudinal section (L) is between 0.4 and 0.65.