Contact Probe Flange Locking for Rotation Suppression
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Solution Overview
Problem
Existing probe units and contact probes used for conduction state inspection of semiconductor integrated circuits and liquid crystal panels face durability issues due to rotation with respect to the probe holder, leading to reduced strength.
Innovation Solution
The design incorporates a flange portion on the contact probe with a larger orthogonal length than the distal end, featuring a flat surface that locks into a stepped holder hole, preventing rotation and enhancing strength while maintaining contact integrity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If the distal end portion is formed in a flat plate shape to prevent rotation, then rotation prevention is achieved, but the volume is reduced and durability deteriorates
Solution Approach 1:
The contact probe is divided into functionally distinct segments: a distal end portion for electrical contact, a flange portion for rotation prevention, and a proximal end portion for connection. This segmentation allows each part to be optimized independently - the distal end maintains sufficient volume for durability while the flange provides the anti-rotation function through its flat surface and stepped structure.
Solution Approach 2:
The anti-rotation function is achieved by extending the flat surface in a direction orthogonal to the longitudinal axis of the contact probe. This dimensional extension creates a larger flat surface area on the flange portion that can engage with the holder, effectively preventing rotation without reducing the volume of the distal end portion.
2Stability of the object's composition
If the distal end portion is formed in a flat plate shape to prevent rotation, then rotation prevention is achieved, but the volume is reduced and strength deteriorates
Solution Approach 1:
The contact probe is divided into functionally distinct segments: a distal end portion for electrical contact, a flange portion for rotation prevention, and a proximal end portion for connection. This segmentation allows each part to be optimized independently - the distal end maintains sufficient volume for durability while the flange provides the anti-rotation function through its flat surface and stepped structure.
Solution Approach 2:
The anti-rotation function is achieved by extending the flat surface in a direction orthogonal to the longitudinal axis of the contact probe. This dimensional extension creates a larger flat surface area on the flange portion that can engage with the holder, effectively preventing rotation without reducing the volume of the distal end portion.
Data Source
AI summary
A probe unit includes: a plurality of probe groups each including two contact probes configured to come into contact with one electrode of a contact target; and a probe holder configured to hold the contact probes. Each of the two contact probes includes: a distal end portion; and a flange portion extending from a proximal end side of the distal end portion and having a maximum length in a direction orthogonal to a longitudinal axis of the contact probe larger than a maximum length of the distal end portion, the flange portion including a first flat surface portion having a planar shape provided on a part of a side surface of the flange portion, and the holder hole has a stepped shape configured to be locked by the flange portion and has a wall surface abutting on the first flat surface portion.