Contact Probe Enlarged-Head Geometry for Easier, Low-Stress Mounting
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Solution Overview
Problem
Existing probe assembly methods are cumbersome and probes are subjected to high solicitations during functioning, leading to reduced lifespan.
Innovation Solution
A new probe geometry with an enlarged head and beveled lower surface, allowing for a roto-translation mechanism that stabilizes the probe during buckling, facilitating assembly and reducing mechanical stress.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If traditional probe assembly methods are used, then probes can be mounted in the support structure, but the assembly process is cumbersome and complex
Solution Approach 1:
The probe is divided into distinct functional segments: a mounting head portion, a central body, and a contact tip. The support structure is also segmented with separate mounting features. This segmentation allows each component to be optimized independently and assembled through simple alignment of corresponding features, dramatically simplifying the assembly process while maintaining structural integrity.
Solution Approach 2:
The patent introduces intermediary mounting features that act as mediators between the probe and support structure. These include alignment pins, mounting holes, and interface features that facilitate easy connection. The intermediary elements absorb the complexity of alignment and securing, allowing the main probe components to be mounted without complex procedures.
2Reliability
If probes are subjected to high solicitations during functioning, then they can maintain contact force and manage tolerances, but their lifespan is reduced
Solution Approach 1:
The probe design incorporates beforehand cushioning through compliant mounting features and stress-distributing geometry. The mounting head includes features that absorb and distribute mechanical stresses before they reach critical components. This cushioning effect protects the probe from damage during high-solicitation operations, maintaining reliable contact force while extending lifespan by preventing stress concentration and fatigue failure.
Solution Approach 2:
The patent employs parameter changes in the probe geometry, particularly in the central body and mounting head, to optimize the balance between contact force and stress resistance. By adjusting dimensional parameters, material distribution, and structural geometry, the probe can maintain adequate contact force for reliability while reducing peak stresses that would otherwise reduce lifespan. This includes optimizing the buckling characteristics and stress distribution paths.
3Ease of operation
If traditional probe geometry is used, then probes can function during tests, but assembly is difficult and mechanical stress is high
Solution Approach 1:
The probe design employs asymmetric geometry in the mounting head and support interface to simultaneously achieve ease of mounting and stress resistance. The asymmetric features include offset mounting holes, directional alignment pins, and non-uniform wall thicknesses that guide assembly in a single direction while providing built-in stress relief pathways. This asymmetric design makes the mounting process intuitive and simple while the geometric features inherently distribute and reduce mechanical stresses during operation.
Data Source
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AI summary
The present invention relates to a contact probe (10) for electronic tests comprising: • - An upper part (12) having an end portion (12') whose end is intended to contact a first electronic component; • - A lower part (13) having an end portion (13c) whose end is intended to contact a second electronic component; • - A generally elongated and deformable central body (11), said central body being interposed between said upper part and lower part; • - Wherein said lower part (13) comprises an enlarged head (13D) having a lower surface (13D') which in use is intended to rest at least partially onto a horizontal surface (25, X), said lower surface (13D') being configured so as to have an inclination (a) with respect to the horizontal surface (25, X) onto which it rests in a rest condition of the unbuckled probe and, in condition of buckle of the probe, there is at least one buckled position in which said lower surface (13D') moves to rest entirely onto the horizontal surface thus zeroizing said angle (a).