Contact Probe With Plate-Shaped Second Terminal
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Solution Overview
Problem
The existing contact probes for inspecting semiconductor integrated circuits face challenges in mass production due to high manufacturing costs and unstable contact states, primarily because of the need for precise machining of cylindrical holes and single-point contact with the inspection substrate, which can be affected by foreign matter.
Innovation Solution
A contact probe design featuring a rod-shaped first contact terminal and a plate-shaped second contact terminal with multiple contact elements, clamped by a coil spring, allowing for frictional contact and stable engagement without the need for drilling, enabling easier mass production and reduced manufacturing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a cylindrical hole is formed in the second contact terminal by cutting to achieve precise inner diameter and coaxiality, then the contact precision is improved, but the machining time becomes long, leading to decreased mass productivity and increased manufacturing cost
Solution Approach 1:
The invention removes the cylindrical hole structure from the second contact terminal. Instead of forming a precise cylindrical hole by cutting, the second contact terminal is designed as a plate-shaped member with multiple contact portions that directly contact the inspection substrate. This extraction of the complex hole structure eliminates the need for long machining time while maintaining contact precision through the distributed contact portions.
Solution Approach 2:
The second contact terminal is segmented into multiple second contact elements (first, second, and third contact portions) that are distributed across the plate-shaped member. This segmentation allows the contact function to be achieved through multiple simpler contact points rather than a single complex cylindrical hole, improving both manufacturability and contact stability.
2Device complexity
If a single contact portion is provided in the second contact terminal, then the structure is simple, but the contact state becomes unstable when foreign matter is caught between the contact portion and the land of the inspection substrate
Solution Approach 1:
The second contact terminal is divided into multiple second contact elements (first, second, and third contact portions) that are spatially distributed. This segmentation ensures that if foreign matter interferes with one contact portion, the other contact portions can still maintain stable electrical connection, thereby improving contact reliability without significantly increasing structural complexity.
Solution Approach 2:
The invention changes the parameter of contact redundancy by providing multiple contact portions instead of a single contact point. This parameter change transforms the contact system from a single-point contact to a multi-point contact system, enhancing reliability against foreign matter interference while keeping the overall structure relatively simple.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design facilitates stable electrical connections by distributing contact points across multiple elements, reducing the risk of unstable contacts and lowering production costs, while maintaining high precision and reliability.
Implementation Method 1
the elastic body is constituted by a coil spring provided so as to surround at least a part of the first contact element and the second contact element, to elastically press the first contact portion of the first contact element against the first electrode, and to elastically press the second contact portion of the second contact element against the second electrode
Implementation Method 2
the second contact terminal is constituted by a plurality of second contact elements, that are formed by a plate-shaped metal member, provided with a second contact portion that contacts with the second electrode, and clamp the first contact element in a frictional contact with a part of the first contact element
Data Source
AI summary
A contact probe can be easily mass-produced, reduce manufacturing cost, and obtain a stable contact state with an electrode such as a land of an inspection substrate. An inspection socket can be provided with the contact probe. The contact probe has a first contact terminal that contacts a solder ball of a device under test and a second contact terminal that contacts a land of a printed substrate, and a coil spring for urging contact terminals so as to separate the first and the second terminals. The first contact terminal is constituted by a first contact element formed by a rod-shaped metal member, and the second contact terminal is constituted by two second contact elements formed by a plate-shaped metal member and which clamp the first contact element in frictional contact with a part of the first contact element.