Contactor Integrated Circuit Memory for Production Testing

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In high-volume production testing of electrical products, such as integrated circuit packages and wafers, the large number of contactors used makes it challenging to monitor and identify individual contactors, leading to difficulties in determining when replaceable components need to be replaced for proper operation.

Innovation Solution

Incorporating an integrated circuit (IC) with memory into the contactor to store information like an identifier, usage count, and replaceable component replacement history, allowing the test system to retrieve and analyze this data for maintenance decisions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a large number of contactors are used in production testing, then productivity is improved, but the ability to identify and monitor individual contactors deteriorates

Engineering Contradiction:
Improveproduction testing volumeVSAvoidcontactors identification capability
Core Design Contradiction:
ProductivityVSLoss of information

Solution Approach 1:

The patent applies the copying principle by implementing a memory device within each contactor that stores a unique identifier. Instead of relying on physical tracking of individual contactors, the system creates a digital copy of contactor identity information that can be read by the test system. This allows thousands of contactors to be used while maintaining the ability to identify and monitor each one through its stored identifier.

Inventive Principle:
Principle #26Copying

2Ease of repair

If replaceable components are used in contactors, then ease of repair is improved, but the ability to track usage and determine replacement timing deteriorates

Engineering Contradiction:
Improvecomponent replaceabilityVSAvoidusage tracking capability
Core Design Contradiction:
Ease of repairVSLoss of information

Solution Approach 1:

The patent implements feedback by having the memory device continuously store and provide information about contactor usage count and replacement history. The test system can read this information and provide feedback to operators about when components need replacement. This creates a closed-loop system where usage data is tracked, analyzed, and used to guide maintenance decisions, ensuring replaceable components are replaced at optimal times.

Inventive Principle:
Principle #23Feedback

3Device complexity

If manual tracking of contactor usage is used, then device complexity is reduced, but measurement precision of usage data deteriorates

Engineering Contradiction:
Improvemonitoring system complexityVSAvoidusage data accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies self-service by embedding a memory device directly within each contactor that automatically tracks and stores usage information without requiring external manual recording systems. The contactor essentially monitors its own usage and maintains an accurate record of its operation history. This self-tracking mechanism provides precise usage data while minimizing the complexity of external monitoring infrastructure.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11047905B2Contactor with integrated memory
Publication Date: 2021.06.29 ANALOG DEVICES INT UNLTD CO
  • US11047905B2 patent drawing
  • US11047905B2 patent drawing
  • US11047905B2 patent drawing

AI summary

There is disclosed herein a contactor for production testing of an electrical product, where the contactor includes an integrated circuit with memory. The integrated circuit may store information related to the contactor in the memory that may be useful for the production testing. For example, the memory may store information that that can be used for identifying the contactor and/or determining whether maintenance of the contactor should be performed to achieve proper results of the production testing.