Contactor Probe Switching for Multi-Device Test Efficiency
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Solution Overview
Problem
Existing electronic device testing systems, such as those described in U.S. Pat. No. 5,736,850, lack the capability to efficiently provide power, ground, and test signals to multiple electronic devices simultaneously and do not optimize relay placement or touchdown sequences for enhanced testing efficiency.
Innovation Solution
A contactor device with a plurality of probes is electrically connected to a source of test signals, and switches are used to selectively connect these signals to different groups of probes, allowing for efficient testing of multiple electronic devices by switching resources between probe sets and optimizing the layout for improved testing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If relays are placed in the test head to switch connections between test sites, then connection switching capability is provided, but the system cannot provide power, ground, and test signals to multiple electronic devices simultaneously
Solution Approach 1:
The probe card is divided into multiple independently controllable probe sets (first probe set, second probe set, etc.), each capable of being selectively connected to tester resources. This segmentation allows different probe sets to be assigned to different electronic devices, enabling simultaneous testing of multiple devices while maintaining system manageability.
Solution Approach 2:
The tester resources (power, ground, test signal sources) are designed to be universally applicable to multiple probe sets. The same tester resources can be dynamically assigned to different probe sets based on testing requirements, allowing a single tester to support testing of multiple electronic devices without requiring separate dedicated resources for each device.
2Productivity
If relays are used for switching connections, then connection switching is enabled, but testing efficiency for multiple electronic devices is not optimized
Solution Approach 1:
The system employs dynamic switching capabilities where probe sets can be flexibly assigned and reassigned to different electronic devices during the testing process. The touchdown sequence is optimized dynamically based on the specific testing scenario, allowing the system to adapt to varying testing requirements and maximize productivity without being constrained by fixed relay configurations.
Solution Approach 2:
The probe card layout is pre-optimized with multiple probe sets arranged to facilitate efficient touchdowns on various electronic device configurations. The switching matrix is pre-configured to enable rapid reassignment of probe sets, allowing the system to quickly adapt to different testing scenarios without requiring complex real-time decision-making or intricate relay placement optimizations.
3Adaptability or versatility
If a fixed probe card layout is used, then simple structure is maintained, but the ability to efficiently test multiple electronic devices with different configurations is limited
Solution Approach 1:
The probe card is segmented into multiple independent probe sets that can be selectively activated and assigned to different electronic devices. This segmentation allows the same probe card to accommodate various device configurations by enabling or disabling specific probe sets as needed, providing layout flexibility without requiring complete redesign for each device type.
Solution Approach 2:
The probe card incorporates dynamic switching mechanisms that allow real-time reconfiguration of probe set assignments. The switching matrix can be programmed to connect different probe sets to different testers or test groups based on the specific electronic device being tested, providing adaptability to various device configurations while maintaining a relatively simple fixed physical structure.
Data Source
AI summary
A contactor device comprising a plurality of probes disposed to contact ones of the electronic devices can be electrically connected to a source of test signals. A switch can be activated electrically connecting a connection to the source of test signals to a selected one of a first group of electrically connected ones of the probes disposed to contact a first set of a plurality of the electronic devices or a second group of electrically connected ones of the probes disposed to contact a second set of a plurality of the electronic devices.