Contactor Assembly with Redundant Pins for Semiconductor Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The challenge in semiconductor device testing is ensuring adequate electrical contact between contactor pins and device contact surfaces, leading to false test readings and unnecessary rejection of functional devices due to contamination and poor contact quality.
Innovation Solution
The use of contactor assemblies that simultaneously contact multiple locations on a semiconductor device's contact surface with redundant paths, ensuring reliable electrical contact and reducing the need for frequent cleaning or repair of test equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single contactor pin is used to contact the device electrode, then the contactor assembly is simple and easy to manufacture, but the electrical contact reliability is poor due to contamination and debris
Solution Approach 1:
The patent applies local quality by making different parts of the contactor pin serve different functions: the pin body provides structural support while the contact tip provides electrical contact. The contactor pin is designed with specific local properties (conductive material, contact tip geometry) optimized for electrical contact reliability at the contact point, while the rest of the assembly maintains simplicity.
Solution Approach 2:
The patent implements beforehand cushioning by providing redundant contact paths through multiple contactor pins before contamination can cause test failures. The additional pins act as a backup that compensates for potential contamination or poor contact at any single pin location, ensuring reliable electrical contact even when debris is present.
2Reliability
If multiple contactor pins are used to contact the same electrode, then the electrical contact reliability improves with redundant paths, but the contactor assembly complexity and manufacturing difficulty increase
Solution Approach 1:
The patent applies universality by designing the contactor pins to serve multiple functions: they provide electrical contact, mechanical support, and redundant backup paths. The same basic pin structure is used repeatedly across multiple contacts, allowing standardized manufacturing processes to be applied universally to all pins, which reduces overall manufacturing complexity despite the increased number of components.
Solution Approach 2:
The patent uses segmentation by dividing the electrical contact function across multiple independent contactor pins rather than relying on a single complex contact mechanism. Each pin is a simple, independent component that can be manufactured separately and assembled into the contactor assembly, making the overall system easier to manufacture despite providing redundant contact paths.
3Reliability
If frequent cleaning and repair of test equipment is performed, then the electrical contact quality is maintained, but the testing process interruptions increase and productivity decreases
Solution Approach 1:
The patent implements beforehand cushioning by building redundancy into the contact system in advance, so that contamination or wear does not immediately affect test quality. The multiple contactor pins provide backup paths that compensate for degradation, allowing the test equipment to operate for longer periods between cleaning and maintenance cycles, thereby maintaining productivity.
Solution Approach 2:
The patent applies self-service by designing the contactor assembly to automatically compensate for contact degradation through its redundant pin structure. When one pin becomes contaminated or wears, the system automatically relies on the other pins to maintain electrical contact, eliminating the need for frequent manual intervention, cleaning, or repair.
4Measurement precision
If redundant contact paths are implemented, then the probability of false test readings is reduced, but the device complexity and testing setup complexity increase
Solution Approach 1:
The patent applies local quality by concentrating the redundancy function at the contactor pin level rather than throughout the entire testing system. The multiple pins provide local redundancy at the critical electrical contact point, improving measurement precision without requiring complex redundant paths throughout the entire test setup, thus limiting complexity increases to the minimal necessary level.
Data Source
AI summary
A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode includes a tester load board and a contactor body coupled to the tester load board. A plurality of contactor pins carried by the contactor body includes a first contactor pin and a second contactor pin that are electrically coupled to the tester load board. The tester load board is configured to couple the plurality of contactor pins to automatic test equipment (ATE) for testing the DUT. The first contactor pin and second contactor pin are positioned to both contact the first electrode. A first path to the first contactor pin and a second path to the second contactor pin are electrically shorted together by the contactor assembly to be electrically in parallel to provide redundant paths to the first electrode during automated testing of the DUT.