Continuous ALD Moving Bed Deposition Without Purge Stages

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Solution Overview

Problem

Conventional atomic layer deposition (ALD) methods require complex structures and precise tolerances to isolate reacting gases, leading to inefficient precursor utilization and increased costs due to the need for purge regions and dosing valves, making the process impractical for commercial applications.

Innovation Solution

A method and system where a fixed precursor gas is continuously injected over a moving substrate, ensuring precursor exhaustion without the need for purge stages or dosing valves, allowing for 100% material utilization and simplified equipment design.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional ALD methods use sequential exposures with physical isolation of gases, then homogeneous films are achieved, but device complexity and manufacturing costs increase due to purge regions and dosing valves

Engineering Contradiction:
Improvefilm homogeneityVSAvoidsystem structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent removes the enclosure structure entirely from the ALD system. Instead of physically isolating gases in separate chambers, the method extracts the isolation function by using a moving substrate that sequentially passes through different gas zones, achieving film homogeneity without complex enclosure structures

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces dynamic motion of the substrate through the gas flow. By moving the substrate continuously through zones with different gaseous species, the system achieves sequential exposure without static enclosures or complex valve mechanisms, reducing device complexity while maintaining film quality

Inventive Principle:
Principle #15Dynamics

2Reliability

If conventional ALD methods use purge regions to separate gas zones, then gas-phase reactions are prevented, but precursor utilization efficiency decreases due to material waste in purge areas

Engineering Contradiction:
Improvereaction controlVSAvoidprecursor utilization
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent implements continuous substrate motion through the reaction zones, eliminating idle purge regions. Every portion of the substrate is continuously exposed to reactive gases during its transit, ensuring 100% precursor utilization with no waste in purge areas, while maintaining reliable reaction control through controlled exposure timing

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The moving substrate acts as an intermediary that carries the deposition process through different gas zones without requiring physical barriers. The substrate's motion mediates between gas-phase separation needs and precursor efficiency, allowing reactive gases to be introduced sequentially without mixing or waste

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If conventional ALD methods use airtight sealing of gas enclosures, then gas isolation is achieved, but relative motion between substrate and enclosure becomes impossible

Engineering Contradiction:
Improvegas isolationVSAvoidsubstrate conveyance speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The patent converts the static enclosure model into a dynamic open-flow system. Instead of sealing gases in fixed chambers, the method uses continuous gas flow zones with a moving substrate, enabling high-speed conveyance while maintaining effective gas isolation through the sequential exposure mechanism

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent replaces the mechanical sealing system with a flow-based isolation mechanism. Instead of using airtight enclosures and seals, the system uses controlled gas flows and substrate motion to achieve effective isolation, eliminating mechanical constraints on substrate speed

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Manufacturing precision

If conventional ALD methods use enclosures with moving substrates, then deposition is achieved, but tight tolerance features are required for chemical and mechanical precision

Engineering Contradiction:
Improvedeposition controlVSAvoidsystem tolerance
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The moving substrate serves itself by sequentially passing through different gas zones, automatically achieving sequential exposure without requiring precise mechanical positioning or tight tolerances. The substrate's own motion through the flow field provides the necessary deposition control, simplifying manufacturing requirements

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in higher quality products with reduced equipment costs, increased throughput, and lower maintenance requirements, achieving 95% coverage with fewer operational complexities compared to traditional spatial ALD methods.

Implementation Method 1

the amount of precursor molecules released is less than the available reaction sites presented on a reaction surface by the moving bed/web incident to the flow. This methodology leads to the complete exhaustion of precursor gas

Methodology Applied
Scientific EffectAdsorption: Adsorption

Data Source

PatentUS12163221B2System for continuous atomic layer deposition
Publication Date: 2024.12.10 UCHICAGO ARGONNE LLC
  • US12163221B2 patent drawing
  • US12163221B2 patent drawing
  • US12163221B2 patent drawing

AI summary

A system and method for continuous atomic layer deposition. The system and method includes a housing, a moving bed which passes through the housing, a plurality of precursor gases and associated input ports and the amount of precursor gases, position of the input ports, and relative velocity of the moving bed and carrier gases enabling exhaustion of the precursor gases at available reaction sites.