Fe-Ni Deposition Mask Plate with Controlled Diffraction and Grain Size

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Solution Overview

Problem

The existing deposition masks for OLED pixel deposition suffer from non-uniform through-hole formation due to uneven etching, leading to reduced deposition efficiency and failures, as a result of surface pits and variations in the depth, diameter, and shape of the through-holes.

Innovation Solution

The iron-nickel alloy metal plate is designed with controlled diffraction intensity ratios and crystal grain sizes to minimize uneven etching, ensuring uniform through-hole characteristics by controlling the diffraction intensity ratios of (111), (200), and (220) planes, and limiting crystal grain areas and diameters to 700 μm² and 30 μm respectively, with a density of 0.20-0.25 ea/μm².

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional metal plates are used for deposition masks, then manufacturing is simpler, but surface pits and uneven etching occur leading to non-uniform through-holes

Engineering Contradiction:
Improveuniformity of through-hole formationVSAvoidcontrol of diffraction intensity ratios and crystal grain parameters
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by precisely controlling the diffraction intensity ratios (I111/I200 and I220/I200) and crystal grain parameters (area and diameter) of the metal plate. These parameter specifications ensure uniform etching behavior and prevent surface pit formation, directly resolving the technical contradiction between manufacturing precision and device complexity.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements preliminary action by pre-controlling the crystal structure and grain parameters of the metal plate before the etching process. By establishing the desired diffraction intensity ratios and crystal grain characteristics in advance, the metal plate is prepared to resist uneven etching and surface pit formation during subsequent manufacturing steps.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If surface etching is performed to remove impurities, then surface cleanliness improves, but dent phenomenon and pits are generated

Engineering Contradiction:
Improvesurface cleanliness and impurity removalVSAvoiduniformity of surface morphology
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies beforehand cushioning by pre-establishing optimal crystal grain parameters and diffraction intensity ratios in the metal plate before surface etching. This preliminary structural optimization acts as a cushion against the harmful effects of etching, allowing impurity removal while preventing the formation of deep pits and surface dents that would otherwise occur.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Solution Approach 2:

The patent uses parameter changes by specifying precise ranges for diffraction intensity ratios and crystal grain dimensions. These parameter controls modify the metal plate's response to etching, enabling effective impurity removal while maintaining surface uniformity and preventing excessive pit formation.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If through-holes are formed with varying depth and diameter, then manufacturing flexibility increases, but deposition efficiency decreases

Engineering Contradiction:
Improvedeposition efficiencyVSAvoidcontrol of through-hole characteristics
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by establishing specific ranges for crystal grain area (60-700 μm²) and diameter (2-30 μm), along with diffraction intensity ratios. These parameter specifications ensure that etching produces through-holes with uniform depth and diameter, maximizing deposition efficiency while avoiding the need for complex post-processing to correct non-uniformities.

Inventive Principle:
Principle #35Parameter changes

4Manufacturing precision

If crystal grain size is reduced to minimize surface pits, then etching uniformity improves, but manufacturing difficulty increases

Engineering Contradiction:
Improveuniformity of etching and reduction of surface pitsVSAvoidcontrol of crystal grain parameters
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent applies parameter changes by defining specific ranges for crystal grain parameters (area: 60-700 μm², diameter: 2-30 μm) and diffraction intensity ratios. These parameter specifications achieve uniform etching and minimize surface pits while remaining practically achievable through standard metal processing techniques, balancing manufacturing precision with ease of manufacture.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach minimizes surface defects, enhances deposition efficiency, and prevents deposition failures by ensuring uniformity in through-hole formation, thereby improving the overall quality of the deposition mask.

Implementation Method 1

diffraction intensity of a (111) plane of the alloy metal plate is defined as I (111), diffraction intensity of a (200) plane of the alloy metal plate is defined as I (200), diffraction intensity of a (220) plane of the alloy metal plate is defined as I (220)

Methodology Applied
Scientific EffectX-ray diffraction: Bragg Diffraction

Data Source

PatentUS20250305109A1Alloy metal plate and deposition mask including alloy metal plate
Publication Date: 2025.10.02 LG INNOTEK CO LTD
  • US20250305109A1 patent drawing
  • US20250305109A1 patent drawing
  • US20250305109A1 patent drawing

AI summary

In an alloy metal plate according to an embodiment, diffraction intensity of a (111) plane of the alloy metal plate is defined as I (111), diffraction intensity of a (200) plane of the alloy metal plate is defined as I (200), diffraction intensity of a (220) plane of the alloy metal plate is defined as I (220), a diffraction intensity ratio of I (200) is defined by the following Equation 1, and a diffraction intensity ratio of I (220) is defined by the following Equation 2. At this time, the A is 0.5 to 0.6, the B is 0.3 to 0.5, and the value A may be larger than a value B.A=I⁡(2⁢0⁢0)/{I⁡(2⁢0⁢0)+I⁡(2⁢2⁢0)+I⁡(1⁢1⁢1)}[Equation⁢ 1]The diffraction intensity ratio of I (220) is defined by the following Equation 2.B=I⁡(2⁢2⁢0)/{I⁡(2⁢0⁢0)+I⁡(2⁢2⁢0)+I⁡(1⁢1⁢1)}[Equation⁢ 2]In addition, in an iron (Fe)-nickel (Ni) alloy metal plate of a deposition mask for OLED pixel deposition according to an embodiment, the metal plate is formed of a plurality of crystal grains, and the maximum area of the crystal grains measured over the entire area of the metal plate is 700 μm2 or less.