Storage Controller Register Testing Without Vector Memory
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Solution Overview
Problem
Existing methods for testing storage controllers in semiconductor memory devices are costly and inefficient, particularly due to the need for expensive test equipment with vector memory, which increases the cost and time required for testing.
Innovation Solution
A method for testing storage controllers using a test equipment that does not include a vector memory, utilizing a special command to access designated special function registers and perform write and read operations to determine the controller's functionality, thereby reducing costs and time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test equipment with vector memory is used to test storage controllers, then testing capability and reliability are improved, but cost and device complexity increase
Solution Approach 1:
The patent extracts the essential testing functionality from complex vector memory-based test equipment and implements it using simple register write-read operations. By focusing only on the critical path of controller testing through special function registers, the solution eliminates the need for expensive vector memory while maintaining testing capability.
Solution Approach 2:
The patent replaces expensive, complex test equipment with simpler, more economical test equipment that uses basic register operations. The approach uses disposable-like simplicity in test methodology, relying on straightforward write-command and read-command sequences rather than investing in sophisticated vector memory infrastructure.
2Reliability
If test equipment with vector memory is used to test storage controllers, then testing capability is improved, but testing time increases
Solution Approach 1:
The patent skips the time-consuming processes associated with vector memory operations by directly writing to and reading from special function registers. This approach rushes through the essential testing steps without the overhead of complex memory management, initialization, and data transfer protocols required by vector memory-based systems.
Solution Approach 2:
The patent performs preliminary actions by directly configuring the controller through register writes before execution, eliminating the need for preliminary vector memory setup. The test commands are prepared and executed in a streamlined sequence that avoids time-consuming preconfiguration steps.
3Device complexity
If simple test equipment without vector memory is used, then cost and time are reduced, but testing capability may be insufficient
Solution Approach 1:
The patent changes the operational parameters of the test equipment from vector memory-based operations to register-based operations. By altering the testing methodology to use write-commands and read-commands targeting special function registers, the solution achieves effective controller testing with simplified equipment, proving that parameter changes can maintain capability while reducing complexity.
Solution Approach 2:
The patent introduces special function registers as intermediaries between the simple test equipment and the storage controller. These registers serve as a communication bridge that enables comprehensive controller testing through straightforward write-read operations, eliminating the need for complex vector memory while preserving testing effectiveness.
Data Source
AI summary
A method of testing a storage controller included in a storage device may include supplying power to the storage device, transmitting a write command including an algorithm pattern corresponding to a designated special function register of the storage controller, transmitting a read command corresponding to the designated special function register, receiving a chip ID response corresponding to the read command, and determining whether the storage controller is defective based on the chip ID response.