Data Converter Offset Correction Testing With Built-In Diagnostics
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Solution Overview
Problem
There is a need for a testing method and self-diagnostic function in data converters to ensure all correction states, particularly after shipping, as correction elements can change due to accuracy improvements, power consumption reduction, and speed enhancements, and existing methods struggle to identify faulty parts within correction elements and driver circuits.
Innovation Solution
A semiconductor circuit configuration that includes a data converter with a correction element group for nonlinearity correction and a test element group for testing these correction elements, allowing the digital circuit to test and diagnose the correction elements using the test elements, enabling comprehensive testing and diagnosis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If correction elements are added to improve accuracy and reduce power consumption, then manufacturing precision and reliability are improved, but device complexity increases and testing difficulty worsens
Solution Approach 1:
The patent segments the correction elements into individually testable units by providing separate test signal input terminals and switch circuits for each correction element. This allows each correction element to be tested independently, managing the complexity of testing multiple correction elements without requiring a completely separate test system.
Solution Approach 2:
The patent introduces switch circuits as intermediary components between the test signal input terminals and the correction elements. These switches act as mediators that control the connection between test signals and specific correction elements, enabling systematic testing while maintaining circuit organization and managing complexity.
2Reliability
If correction elements are added to enhance performance, then reliability is improved, but ease of operation deteriorates due to increased testing requirements
Solution Approach 1:
The testing operation is segmented into individual tests for each correction element through separate test signal input terminals. This allows operators to test only the specific correction element that needs verification, rather than requiring comprehensive testing of all correction elements, thereby improving ease of operation.
Solution Approach 2:
The patent enables partial testing by allowing operators to apply test signals to only those correction elements that require testing, rather than requiring all correction elements to be tested simultaneously. This partial action approach simplifies the testing operation while still ensuring reliability of the tested elements.
3Measurement precision
If comprehensive testing of correction elements is implemented, then measurement precision is improved, but loss of time increases due to extended testing procedures
Solution Approach 1:
The testing process is segmented into independent parallel tests for each correction element. This segmentation allows multiple correction elements to be tested simultaneously or selectively, reducing the total testing time while maintaining comprehensive fault detection capability for each individual element.
Solution Approach 2:
The patent enables selective testing where only the necessary correction elements are tested based on specific diagnostic needs, rather than requiring comprehensive testing of all correction elements in all situations. This partial testing approach reduces time loss while maintaining adequate measurement precision for the tested elements.
Data Source
AI summary
A semiconductor circuit includes: an analog circuit that inputs a measured signal; and a digital circuit that outputs a digital output signal. The analog circuit includes: a correction element group including one or more correction elements each for correcting an offset that is an amount of shift caused by a variation in characteristics of the analog circuit to occur in a path for transmitting the measured signal; and a test element group including one or more test elements for testing the one or more correction elements. The digital circuit tests the correction element group using the test element group.