Conveying Arrangement for Electronic Device Testing

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Solution Overview

Problem

Current testing systems for electronic devices, such as robotic arms, often misposition electronic devices during delivery due to multiple degrees of freedom, leading to increased maintenance costs and potential device damage.

Innovation Solution

A conveyor arrangement with a plate system that elevates and lowers through openings, allowing precise movement and positioning of electronic devices within a drawer-type testing system, reducing degrees of freedom and eliminating the need for expensive robotic arms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a robotic arm is used to deliver electronic devices to testing areas, then the device can be moved to different locations, but the device may be positioned incorrectly due to multiple degrees of freedom

Engineering Contradiction:
Improvedevice delivery capabilityVSAvoiddevice positioning accuracy
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The robotic arm is segmented into multiple modular components (base unit, extension units, testing units) that can be independently positioned and controlled. Each segment has reduced degrees of freedom compared to a traditional robotic arm, allowing precise positioning while maintaining delivery capability to multiple testing areas.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically adjusts the configuration of extension units between the base and testing units, allowing the structure to adapt to different device sizes and testing locations while maintaining stable, precise positioning through controlled mechanical connections rather than multiple independent degrees of freedom.

Inventive Principle:
Principle #15Dynamics

2Adaptability or versatility

If a robotic arm with multiple degrees of freedom is used, then the device can be delivered to various testing areas, but maintenance work and costs increase

Engineering Contradiction:
Improvetesting area coverageVSAvoidmaintenance complexity
Core Design Contradiction:
Adaptability or versatilityVSEase of repair

Solution Approach 1:

The system is divided into independent modular units (base unit, extension units, testing units) that can be maintained separately. Each module has simplified mechanics with fewer degrees of freedom, reducing maintenance complexity while the modular architecture allows easy replacement or repair of individual components without affecting the entire system.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Extension units serve multiple functions: they extend the reach to different testing areas, provide structural support, and enable positioning adjustments. This multi-functionality reduces the need for multiple specialized components, simplifying maintenance while maintaining versatility.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Extent of automation

If a robotic arm is used for device delivery, then automation is achieved, but the system complexity and cost increase

Engineering Contradiction:
Improvedevice delivery automationVSAvoidsystem complexity
Core Design Contradiction:
Extent of automationVSDevice complexity

Solution Approach 1:

The automated delivery system is segmented into standardized modular units with simple, repeatable mechanical connections. Each unit has reduced degrees of freedom compared to a traditional robotic arm, simplifying the control system while maintaining automation capability through coordinated movement of multiple simple modules rather than one complex robotic arm.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentEP3330725B1Conveying arrangement for testing system
Publication Date: 2019.04.10 JOT AUTOMATION OY
  • EP3330725B1 patent drawingFigure 1~2
  • EP3330725B1 patent drawingFigure 3~4
  • EP3330725B1 patent drawingFigure 5~6A

AI summary

There is provided an arrangement (10) for conveying an electronic device in a testing system, the arrangement (10) comprising: a conveyor arrangement (20); a plate (30) comprising at least one opening (32) for the conveyor arrangement; means for elevating the conveyor arrangement (20) through the at least one opening (32) of the plate (30), the conveyor arrangement (20) configured to receive and to convey the electronic device when the conveyor arrangement (20) extends through the at least one opening (32); and means for lowering the conveyor arrangement (20) through the at least one opening (32) of the plate (30), the plate (30) being configured to receive the electronic device from the conveyor arrangement (20) in response to lowering the conveyor arrangement (20) through the at least one opening (32), wherein the plate (30) is further configured to move with respect to the conveyor arrangement (20) and to carry the electronic device to a testing area of the testing system.