Conveyor Elevator Memory Module Tester
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Solution Overview
Problem
Robotic test systems for memory modules are limited by the number of motherboards that can be reached by a robotic arm, leading to increased testing costs due to the high cost of the robotic arm and reduced testing throughput.
Innovation Solution
Implementing a conveyor and/or elevator system to move motherboards away from the robotic arm, allowing multiple motherboards to be tested simultaneously at remote stations, with tested modules returned for removal and new modules inserted, thereby increasing throughput without increasing robotic arm costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If a robotic arm is used to test memory modules on motherboards, then testing can be automated, but the cost of the robotic arm increases and the number of motherboards that can be tested is limited
Solution Approach 1:
The system divides the testing function into multiple independent motherboards, each capable of testing memory modules independently. Instead of using a single complex robotic arm to service all motherboards, the system segments the workload across multiple simpler testing units, reducing the complexity and cost of individual robotic components while maintaining automation.
Solution Approach 2:
The patent introduces a vertical dimension by stacking motherboards vertically and using an elevator mechanism to move them between levels. This allows multiple motherboards to be tested simultaneously at different heights, increasing throughput without requiring a more complex robotic arm to reach further distances.
2Productivity
If more motherboards are tested simultaneously to increase throughput, then testing capacity increases, but the robotic arm becomes more complex and expensive
Solution Approach 1:
The system segments the testing capacity across multiple motherboards arranged in parallel and vertical stacks. Each motherboard handles a portion of the testing workload independently, allowing high throughput without requiring a single overly complex robotic arm to service all motherboards simultaneously.
Solution Approach 2:
By utilizing vertical stacking and elevator transport, the system adds a vertical dimension to the testing arrangement. Multiple motherboards can operate simultaneously at different levels, increasing throughput without expanding the horizontal reach requirements of the robotic arm.
3Productivity
If motherboards are moved away from the robotic arm for remote testing, then multiple motherboards can be tested concurrently, but the system complexity increases due to conveyor and elevator mechanisms
Solution Approach 1:
The conveyor and elevator mechanisms serve as intermediary systems that automatically transport motherboards between the robotic arm and the remote testing stations. These intermediaries handle the complexity of movement and positioning, allowing multiple motherboards to be tested concurrently without requiring the robotic arm to directly service each one.
Solution Approach 2:
The system enables motherboards to be automatically positioned and moved through the testing process without continuous robotic arm intervention. The conveyor and elevator systems provide self-service transport, allowing the system to handle multiple motherboards concurrently while reducing the direct workload on the robotic arm.
Data Source
AI summary
A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.