Actively Cooled X-Ray Microstructure Measurement in Hot Rolling Lines

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Solution Overview

Problem

Conventional methods for determining the microstructure of metal products during metallurgical production are inadequate due to the sensitivity of x-ray measuring apparatuses to heat and radiation in industrial environments, leading to unreliable and non-destructive measurements, which can result in metal products with undesired mechanical properties.

Innovation Solution

A device with actively cooled x-ray source and detector housed in a receptacle chamber with a heat-resistant window, allowing for reliable in-line determination of microstructure in high-temperature environments, using x-ray diffraction to measure crystallinity, phase composition, and mechanical stresses without damaging the equipment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If x-ray measuring apparatuses are used in high-temperature industrial environments, then microstructure determination is possible, but the equipment is damaged by heat and radiation

Engineering Contradiction:

Improvemeasurement reliabilityVSAvoidheat damage to equipment

Core Design Contradiction:

ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The system is divided into separate components: the x-ray source and detector are housed in a protected receptacle chamber, while the metal product moves through the high-temperature zone. This segmentation isolates the sensitive measuring equipment from the harmful thermal environment, allowing reliable measurements without exposing the apparatus to damaging heat and radiation

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

A receptacle chamber with x-ray permeable windows acts as an intermediary structure between the protected measurement equipment and the high-temperature industrial environment. This intermediary allows x-ray radiation to pass through while blocking harmful heat and radiation from reaching the sensitive x-ray source and detector

Inventive Principle:

Principle #24Intermediary (Mediator)

2Productivity

If conventional measuring technologies are used to monitor production parameters, then process control is possible, but the relationship between measured parameters and microstructure changes due to process variations

Engineering Contradiction:

Improveproduction efficiencyVSAvoidmicrostructure measurement accuracy

Core Design Contradiction:

ProductivityVSMeasurement precision

Solution Approach 1:

The patent replaces conventional indirect measurement methods (monitoring temperature, speed, force) with direct x-ray diffraction measurement of microstructure. This substitution provides precise, direct measurement of the actual microstructure rather than relying on correlations between process parameters and microstructure, which change with process variations

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Loss of information

If in-line measuring technology is implemented for microstructure determination, then real-time quality control is possible, but the measuring apparatuses are damaged by the rough industrial environment

Engineering Contradiction:

Improvemicrostructure information availabilityVSAvoidenvironmental damage to equipment

Core Design Contradiction:

Loss of informationVSObject-affected harmful factors

Solution Approach 1:

The receptacle chamber with x-ray permeable windows is designed beforehand to protect the x-ray source and detector from environmental damage. This protective structure is in place before the equipment is exposed to the rough industrial environment, cushioning the sensitive components from heat, radiation, and other harmful factors while allowing x-ray measurements to proceed

Inventive Principle:

Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise and consistent measurement of metal product microstructure, reducing production rejects and costs, improving yield, and allowing for real-time process adjustments to achieve desired mechanical properties, while preventing equipment damage from heat and radiation.

Implementation Method 1

The metal product in the case of this technology is radiated by x-rays which, according to Bragg's law, are diffracted on the lattice planes of the crystal structure of the metal product

Methodology Applied

Scientific EffectX-ray diffraction: Bragg Diffraction

Implementation Method 2

at least one cooling installation for actively cooling the receptacle chamber

Methodology Applied

Scientific EffectActive cooling: Cooling

Data Source

PatentUS11249037B2Device and method for determining the microstructure of a metal product, and metallurgical installation

Publication Date: 2022.02.15 SMS GROUP GMBH

AI summary

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.