Small-gap coplanar tunable capacitors with sidewall spacers

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Solution Overview

Problem

Current tunable capacitors face challenges in achieving optimal power handling and linearity due to the need for multiple long thin bias lines, which can lead to electrostrictive resonance and high tuning voltages, making them less efficient for high-frequency applications.

Innovation Solution

A coplanar tunable capacitor design incorporating sidewall spacers and a voltage-tunable dielectric layer, where the sidewall spacers define the dielectric thickness and separate the bias lines from the RF electrode, reducing electrostrictive resonance and tuning voltage, and allowing for the use of high-K ferroelectric materials like BST.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple long thin bias lines are used in current tunable capacitors, then capacitance tuning capability is achieved, but electrostrictive resonance and high tuning voltages occur

Engineering Contradiction:
Improvecapacitance tuning capabilityVSAvoidelectrostrictive resonance
Core Design Contradiction:
Adaptability or versatilityVSObject-generated harmful factors

Solution Approach 1:

The capacitor structure is segmented into distinct regions with separate bias lines and RF electrodes, where sidewall spacers create isolated capacitor regions. This segmentation prevents the formation of long continuous bias lines that cause electrostrictive resonance, while maintaining capacitance tuning capability through localized electric field control in each segmented region.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Sidewall spacers are introduced as intermediary structures between the bias lines and RF electrodes. These spacers serve as mediators that define the capacitor gap and control the electric field distribution, enabling capacitance tuning without requiring long thin bias lines that generate electrostrictive resonance.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If multiple long thin bias lines are used in current tunable capacitors, then capacitance tuning capability is achieved, but high tuning voltages are required

Engineering Contradiction:
Improvecapacitance tuning capabilityVSAvoidtuning voltage
Core Design Contradiction:
Adaptability or versatilityVSPower

Solution Approach 1:

The capacitor structure is segmented into distinct regions with separate bias lines and RF electrodes, where sidewall spacers create isolated capacitor regions. This segmentation prevents the formation of long continuous bias lines that cause electrostrictive resonance, while maintaining capacitance tuning capability through localized electric field control in each segmented region.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a planar configuration to a three-dimensional structure using sidewall spacers that extend vertically. This dimensional change allows the bias lines to be separated from the RF electrodes in the vertical dimension, reducing the required tuning voltage while maintaining capacitance control through the spacer-defined gap.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Manufacturing precision

If deep-submicron lithography is used to achieve small gaps, then manufacturing precision is improved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improvegap dimension precisionVSAvoidlithography complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

Sidewall spacers are introduced as intermediary structures between the bias lines and RF electrodes. These spacers serve as mediators that define the capacitor gap and control the electric field distribution, enabling capacitance tuning without requiring long thin bias lines that generate electrostrictive resonance.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the manufacturing approach by using sidewall spacer deposition and etching processes instead of direct lithographic patterning for gap definition. This parameter change in the manufacturing process allows gap precision to be achieved through conformal film deposition and anisotropic etching rather than requiring deep-submicron lithography, reducing manufacturing complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design enhances the Q factor, reduces tuning voltage, and improves capacitance, enabling efficient operation at high frequencies without the need for deep-submicron lithography, while maintaining low leakage and flexibility in capacitor design.

Implementation Method 1

A voltage-tunable dielectric layer is disposed over the substrate

Methodology Applied
Scientific EffectDielectric: Dielectric

Implementation Method 2

Tunable capacitors have various uses in RF systems including as voltage-tunable devices

Methodology Applied
Scientific EffectCapacitance: Capacitance

Implementation Method 3

allowing for the use of high-K ferroelectric materials like BST

Methodology Applied
Scientific EffectFerroelectric:

Data Source

PatentEP3480833B1Small-gap coplanar tunable capacitors and methods for manufacturing thereof
Publication Date: 2022.02.23 NXP USA INC
  • EP3480833B1 patent drawingFigure 1
  • EP3480833B1 patent drawingFigure 2
  • EP3480833B1 patent drawingFigure 3

AI summary

A coplanar capacitor that include: a substrate (103); a voltage-tunable dielectric layer (107) over the substrate (103); a plurality of bias lines (109A, 109B,...) over the voltage-tunable dielectric layer (107) wherein the bias lines (109A, 109b,...) are covered by an inter-level dielectric (111A, 111B,..); a plurality of sidewall spacers ( 113A, 113B, 113C, 113D, ... ) wherein each of the sidewall spacers ( 113A, 113B, 113C, 113D, ... ) is located adjacent one of the bias lines (109A, 109B,...) and each of the sidewall spacers (113A, 113B, 113C, 113D, ... ) spans between a respective portion of the voltage-tunable dielectric layer (107) and a respective portion of the inter-level dielectric (111A, 111B,..);; and an electrode (115) over the inter-level dielectric (111A, 111B,..), and over portions of the voltage-tunable dielectric layer (107) that are not covered by the plurality of bias lines (109A, 109B,...) and that are not covered by the sidewall spacers (113A, 113B, 113C, 113D, ... ), wherein a plurality of gaps (117A, 117B) are disposed in the electrode(115).