Coplanar Waveguide Meshing for Lower-Load Field Analysis

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Solution Overview

Problem

Existing electromagnetic field analysis methods for coplanar waveguides are inefficient due to the high computational load caused by generating meshes over the entire reference potential patterns, which are electromagnetically coupled with the signal line.

Innovation Solution

Generate meshes only in a first region that includes the signal line and parts of the reference potential patterns with a constant width, and do not generate meshes in a second region where electromagnetic coupling is weak, using a boundary element or finite element method.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If meshes are generated over the entire reference potential patterns, then electromagnetic field analysis accuracy is maintained, but computational load increases significantly

Engineering Contradiction:
Improveelectromagnetic field analysis accuracyVSAvoidcomputational efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the coplanar waveguide structure into two distinct regions: a first region containing the signal line and adjacent reference potential pattern portions, and a second region containing the remaining reference potential patterns. Different meshing strategies are applied to each region - fine meshing in the first region where electromagnetic coupling is strong, and no meshing or coarse meshing in the second region where coupling is weak. This segmentation enables accurate electromagnetic field analysis while significantly reducing computational load by avoiding unnecessary mesh generation in regions that contribute minimally to the overall field characteristics.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by assigning different mesh densities to different spatial regions based on their electromagnetic coupling characteristics. The first region, which has strong electromagnetic coupling between the signal line and reference potential patterns, receives fine meshing to ensure accurate field calculation. The second region, with weak coupling, receives no meshing or much coarser meshing. This localized differentiation maintains analysis accuracy in critical areas while reducing overall computational complexity.

Inventive Principle:
Principle #3Local quality

2Area of stationary object

If meshes are generated in regions with weak electromagnetic coupling, then complete coverage is achieved, but computational resources are wasted

Engineering Contradiction:
Improvemesh coverage areaVSAvoidcomputational resource consumption
Core Design Contradiction:
Area of stationary objectVSUse of energy by stationary object

Solution Approach 1:

The patent extracts and isolates the first region containing the signal line and its closely coupled reference potential pattern portions from the second region containing the remaining reference potential patterns. By separating these regions and applying different meshing treatments, the invention removes unnecessary mesh generation from the second region where electromagnetic coupling is weak, thereby eliminating wasted computational resources while maintaining adequate analysis coverage in the critical first region.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent applies partial action by generating meshes only in the first region where electromagnetic coupling is strong and significant, rather than providing complete mesh coverage across the entire coplanar waveguide structure. This partial meshing approach is sufficient for accurate electromagnetic field analysis because the weak coupling in the second region contributes minimally to the overall field characteristics, thereby reducing computational resource consumption without sacrificing essential analysis accuracy.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12529734B2Electromagnetic field analysis method, electromagnetic field analysis apparatus, and storage medium
Publication Date: 2026.01.20 SUMITOMO ELECTRIC INDUSTRIES LTD
  • US12529734B2 patent drawing
  • US12529734B2 patent drawing
  • US12529734B2 patent drawing

AI summary

An electromagnetic field analysis method includes generating meshes so that a first mesh is generated in a first region and no mesh or a second mesh is generated in a second region other than the first region in a coplanar waveguide, the coplanar waveguide including a dielectric layer and a conductor pattern having a signal line and reference potential patterns, the first region including the signal line and respective parts of the reference potential patterns and having a constant width in a direction orthogonal to an extending direction of the signal line, the reference potential patterns being spaced away from the signal line and interposing the signal line therebetween, the second mesh having a larger dimension than the first mesh, and performing electromagnetic field analysis on the coplanar waveguide using the meshes.