Block Copolymer Self-Assembly Pattern Uniformity

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Solution Overview

Problem

Current methods for forming high-density repeating patterns using copolymers often result in defects and non-uniformities, making it challenging to achieve the desired pattern density and uniformity required for advanced integrated circuit fabrication.

Innovation Solution

The use of block and graft copolymers that self-assemble into patterns over substrates, with techniques such as thermal or solvent annealing, and the implementation of reservoirs and retaining walls to stabilize copolymer thickness and orientation, ensuring uniformity and reducing defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If copolymers are used to form high-density repeating patterns, then pattern density increases, but defects and non-uniformities increase

Engineering Contradiction:
Improvepattern densityVSAvoidpattern uniformity
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies local quality by creating reservoir regions with different copolymer thicknesses and compositions tailored to specific defect types. Thicker regions serve as material reservoirs to feed thinner regions, while regions with different chemical compositions address specific uniformity issues. This localized variation in copolymer properties enables defect correction without compromising overall pattern density.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent utilizes parameter changes by varying copolymer thickness, composition, and molecular weight across different regions of the substrate. By adjusting these parameters locally, the system optimizes self-assembly behavior in different areas to minimize defects while maintaining high pattern density throughout the structure.

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If copolymer self-assembly is used to form patterns, then manufacturing complexity is reduced, but pattern uniformity deteriorates

Engineering Contradiction:
Improveself-assembly processVSAvoidpattern uniformity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent introduces intermediary regions with intermediate copolymer thicknesses and compositions that mediate between thick and thin regions. These intermediary zones facilitate controlled material flow and stress distribution, enabling uniform pattern formation across the entire substrate while maintaining the simplicity of self-assembly processes.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If copolymer thickness is increased to reduce defects, then material consumption increases, but pattern density is maintained

Engineering Contradiction:
Improvedefect reductionVSAvoidcopolymer material
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent implements preliminary action by pre-forming reservoir regions with thicker copolymer layers before the final patterning step. These pre-prepared reservoirs serve as material sources that feed adjacent thinner regions during subsequent processing, ensuring adequate material availability for defect-free pattern formation without requiring uniform thick copolymer deposition across the entire substrate.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the formation of high-density, uniform patterns with reduced defects, allowing for more precise control over copolymer self-assembly and improved pattern uniformity across substrates, suitable for advanced integrated circuit fabrication.

Implementation Method 1

utilization of a copolymer to form a repeating pattern

Methodology Applied
Scientific EffectSelf-assembly: Self-Assembly

Implementation Method 2

techniques such as thermal or solvent annealing

Methodology Applied
Scientific EffectThermal annealing: Annealing

Data Source

PatentUS8834956B2Methods of utilizing block copolymer to form patterns
Publication Date: 2014.09.16 MICRON TECHNOLOGY INC
  • US8834956B2 patent drawing
  • US8834956B2 patent drawing
  • US8834956B2 patent drawing

AI summary

Some embodiments include methods of forming patterns utilizing copolymer. A main body of copolymer may be formed across a substrate, and self-assembly of the copolymer may be induced to form a pattern of structures across the substrate. A uniform thickness throughout the main body of the copolymer may be maintained during the inducement of the self-assembly. In some embodiments, the uniform thickness may be maintained through utilization of a wall surrounding the main body of copolymer to impede dispersal of the copolymer from the main body. In some embodiments, the uniform thickness may be maintained through utilization of a volume of copolymer in fluid communication with the main body of copolymer.