Copper-Silicon Nitride Bonding Structure for High-Voltage Reliability

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Solution Overview

Problem

Existing bonding methods for copper and ceramic substrates, such as DBC, active metal brazing, and Cu-Mg-Ti alloy pastes, lead to ceramic deterioration, partial discharge, and intermetallic compound phases that cause breaking during high-temperature operation, limiting their use in high-voltage applications.

Innovation Solution

A copper/ceramic bonded body with a magnesium oxide layer and Mg solid solution layer, where Mg reacts with nitrogen to form a magnesium nitride phase, ensuring reliable bonding without Ti, Zr, Nb, and Hf, and limiting intermetallic compound phases to 15% or less, using a vacuum and controlled heating to suppress breaking and enhance migration resistance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If DBC method is used to bond copper sheets to ceramic substrate, then bonding is achieved, but bonding temperature must be set to 1065°C or higher causing ceramic substrate deterioration

Engineering Contradiction:
Improvebonding reliabilityVSAvoidbonding temperature
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

A Cu-Mg-Ti alloy intermediate layer is introduced between the copper sheet and ceramic substrate. The Mg component reacts with the ceramic substrate at lower temperatures (560-800°C) to form a bonding interface, while the Cu provides metallurgical bonding to the copper sheet. This intermediary layer enables bonding at temperatures below the ceramic deterioration threshold.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The bonding process utilizes phase change parameters by controlling the heating temperature range (560-800°C) to trigger specific reactions in the Cu-Mg-Ti alloy. At this temperature range, Mg reacts with the ceramic substrate while avoiding the high-temperature eutectic reaction required in conventional DBC, thus changing the bonding mechanism from high-temperature direct bonding to low-temperature reactive bonding.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If bonding is performed in nitrogen gas atmosphere, then bonding is achieved, but atmospheric gas remains at bonded interface causing partial discharge

Engineering Contradiction:
Improvebonding reliabilityVSAvoidpartial discharge
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent employs a vacuum environment during the bonding process to eliminate atmospheric gases. By performing bonding under vacuum conditions, nitrogen and other atmospheric gases are removed from the bonding interface, preventing their entrapment and subsequent partial discharge issues during high-voltage operation.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

3Reliability

If Cu-Mg-Ti alloy paste is used for bonding, then bonding is achieved, but Ti forms intermetallic compound phases causing ceramic breaking during high-temperature operation

Engineering Contradiction:
Improvebonding reliabilityVSAvoidceramic strength
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent严格控制 the bonding temperature range (560-800°C) to prevent excessive Ti diffusion and intermetallic compound formation. By controlling the temperature parameter, the reaction between Ti and ceramic is limited, avoiding the formation of brittle intermetallic phases that would cause ceramic breaking during high-temperature operation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The Cu-Mg-Ti alloy is designed with specific compositional ratios where Mg is the primary reactive component (5-20 mass%) that interacts with the ceramic substrate, while Ti (1-5 mass%) is present in controlled amounts to provide reinforcement without excessive intermetallic formation. This local compositional optimization ensures bonding reliability while preventing ceramic damage.

Inventive Principle:
Principle #3Local quality

4Reliability

If active metal brazing method is used, then wettability is improved, but Ag migration occurs reducing high-voltage application suitability

Engineering Contradiction:
Improvebonding reliabilityVSAvoidAg migration
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent removes Ag from the bonding material composition entirely, replacing it with a Cu-Mg-Ti alloy system. This extraction of the migratory Ag component eliminates the migration issue while maintaining bonding effectiveness through the reactive Mg component that forms strong bonds with the ceramic substrate without exhibiting migration behavior.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides reliable bonding with excellent migration resistance and suppresses ceramic breaking during high-temperature operation, ensuring high-voltage and high-temperature reliability.

Implementation Method 1

Mg reacts with nitrogen to form a magnesium nitride phase

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Implementation Method 2

using a vacuum and controlled heating to suppress breaking and enhance migration resistance

Methodology Applied
Scientific EffectThermal heating: Heating

Data Source

PatentEP3845509B1Copper/ceramic bonded body, insulating circuit board, method for producing copper/ceramic bonded body, and method for manufacturing insulating circuit board
Publication Date: 2026.01.14 MITSUBISHI MATERIALS CORP
  • EP3845509B1 patent drawingFigure 1~2
  • EP3845509B1 patent drawingFigure 3
  • EP3845509B1 patent drawingFigure 4

AI summary

A copper/ceramic bonded body includes: a copper member (22) made of copper or a copper alloy; and a ceramic member (11) made of a silicon nitride, wherein the copper member (22) and the ceramic member (11) are bonded to each other, a magnesium oxide layer (31) is provided on a ceramic member (11) side of a bonded interface between the copper member (22) and the ceramic member (11), a Mg solid solution layer (32) is provided between the magnesium oxide layer (31) and the copper member (22) and contains Mg in a state of a solid solution in a Cu primary phase, and a magnesium nitride phase (35) is present on a magnesium oxide layer (31) side of the Mg solid solution layer (32).