Copper-Ceramic Substrate Surface Oxidation for Sintered Bonding

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Solution Overview

Problem

Existing copper-ceramic substrates require a precious metal coating for effective bonding with electronic components, which is technically complex and adds manufacturing steps, and conventional copper oxides do not promote strong sintered connections.

Innovation Solution

A copper-ceramic substrate with a copper layer treated to have an energy spectrum indicating the presence of copper(II) oxide, allowing for a strong sintered connection with electronic components without a precious metal coating, using methods like plasma treatment to achieve the desired oxide composition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If the copper-ceramic substrate surface is coated with a precious metal coating to achieve strong bonding with electronic components, then the bonding strength is improved, but the manufacturing complexity and cost increase

Engineering Contradiction:
Improvebonding strengthVSAvoidmanufacturing complexity
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The invention extracts and eliminates the precious metal coating layer from the substrate structure. By modifying the copper layer's surface properties through controlled oxidation, the patent removes the intermediate precious metal layer while maintaining the bonding function, thereby simplifying the manufacturing process and reducing costs.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention changes the chemical composition and surface properties of the copper layer by controlling the oxidation process. By adjusting the oxygen content and creating specific copper oxide phases on the copper layer surface, the patent enables direct bonding with electronic components without requiring precious metal coatings.

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If conventional copper oxide is used on the copper layer surface, then the manufacturing process is simplified, but the sintered connection strength is insufficient

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidsintered connection strength
Core Design Contradiction:
Ease of manufactureVSStrength

Solution Approach 1:

The invention precisely controls the oxidation parameters of the copper layer, including oxygen concentration, temperature, and exposure time. This creates a specific copper oxide layer with optimized chemical composition and microstructure that provides both ease of manufacture and strong sintered connections.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention creates a composite structure within the copper layer, combining metallic copper with controlled copper oxide phases. This composite microstructure provides both the electrical conductivity of copper and the bonding affinity of copper oxide, achieving strong sintered connections without complex manufacturing.

Inventive Principle:
Principle #40Composite materials

3Strength

If the copper layer is heavily oxidized to improve bonding, then the bonding affinity increases, but the electrical conductivity and thermal conductivity decrease

Engineering Contradiction:
Improvebonding affinityVSAvoidelectrical and thermal conductivity
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The invention applies local oxidation only to the surface region of the copper layer, creating a gradient structure where the surface has copper oxide for bonding affinity while the bulk remains metallic copper for conductivity. This localized treatment maintains electrical and thermal performance while providing sufficient bonding affinity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention precisely controls oxidation parameters to limit oxygen penetration depth and concentration. By optimizing temperature, time, and oxygen exposure, the patent creates a thin copper oxide layer at the surface that provides bonding affinity without significantly affecting the bulk electrical and thermal conductivity properties.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The copper-ceramic substrate achieves a strong, cohesive connection with electronic components using sintered material, enhancing thermal stability and simplifying the manufacturing process by eliminating the need for precious metal coatings.

Implementation Method 1

a copper layer which is bonded to the ceramic body, the copper layer having a top side, where an energy spectrum obtained by X-ray photoelectron spectroscopy analysis of the upper surface of the copper layer has a signal comprising at least one peak P1 with a maximum in a range of 933.2 eV - 934.0 eV

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 2

using methods like plasma treatment to achieve the desired oxide composition

Methodology Applied
Scientific EffectPlasma treatment: Plasma

Implementation Method 3

The copper-ceramic substrate achieves a strong, cohesive connection with electronic components using sintered material

Methodology Applied
Scientific EffectSintering: Sintering

Data Source

PatentEP4421054A1Copper-ceramic substrate with sinterable top surface
Publication Date: 2024.08.28 HERAEUS ELECTRONICS GMBH & CO KG
  • EP4421054A1 patent drawingFigure 1
  • EP4421054A1 patent drawing
  • EP4421054A1 patent drawing

AI summary

The invention relates to a copper-ceramic substrate, the use of a copper-ceramic substrate, and a method for producing a metallurgical bond between a copper-ceramic substrate and an electronic component. The copper-ceramic substrate comprises: a) a ceramic body and b) a copper layer that is bonded to the ceramic body over a planar area, wherein the copper layer has a top surface, wherein an energy spectrum obtained from an analysis of the top surface of the copper layer by X-ray photoelectron spectroscopy exhibits a signal that includes at least one peak P1 with a maximum in the range of 933.2 eV - 934.0 eV.