Copper Polishing Agent Composition for High-Speed CMP

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Solution Overview

Problem

Conventional copper polishing agents for CMP processes exhibit low polishing speed and reduced productivity, particularly when dealing with thick copper alloy films required for high-performance circuit boards and TSVs, necessitating a more efficient polishing solution.

Innovation Solution

A polishing agent comprising inorganic acid, amino acid, a protective film-forming agent, an abrasive, an oxidizing agent, and water, with specific ratios and additives such as organic acids and their acid anhydrides, to achieve high polishing speeds exceeding 30000 Å/min, ensuring smooth and rapid polishing of copper films.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional polishing agents are used for thick copper alloy films, then polishing can be performed, but polishing speed is low and productivity is reduced

Engineering Contradiction:
Improvepolishing speedVSAvoidpolishing time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The patent changes the chemical composition parameters of the polishing agent by incorporating specific concentrations of oxidizing agents (0.1-10 wt%), organic acids (0.01-5 wt%), and their acid anhydrides (0.01-5 wt%). This chemical parameter optimization enables significantly higher polishing speeds exceeding 30000 Å/min for thick copper films, directly resolving the contradiction between maintaining polishability and improving productivity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention creates a composite polishing agent system combining multiple components: oxidizing agents (such as hydrogen peroxide, ammonium persulfate), organic acids (such as oxalic acid, maleic acid), acid anhydrides, and abrasive particles. This composite formulation synergistically enhances polishing performance on thick copper alloy films, achieving both high productivity and reduced polishing time

Inventive Principle:
Principle #40Composite materials

2Productivity

If higher polishing speed is achieved, then productivity improves, but surface smoothness may be compromised

Engineering Contradiction:
Improvepolishing speedVSAvoidsurface smoothness
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent optimizes chemical composition parameters including oxidizing agent concentration (0.1-10 wt%), organic acid content (0.01-5 wt%), and acid anhydride content (0.01-5 wt%) to achieve a balanced polishing mechanism. This parameter control enables high polishing speeds while maintaining surface smoothness through controlled oxidation and removal rates

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The organic acids and acid anhydrides act as intermediary substances that mediate between the oxidizing agent and the copper surface. They control the oxidation process to form removable copper oxide layers at optimal rates, ensuring both high polishing speed and smooth surface finish by preventing excessive or uneven oxidation

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The proposed polishing agent significantly enhances polishing speed and productivity, enabling efficient processing of thick copper films up to 10 μm or greater, while maintaining surface smoothness and stability across varying film thicknesses.

Implementation Method 1

The basic mechanism of CMP employing a polishing agent comprising an oxidizing agent is considered to be that the metal film is polished by, first, oxidizing the metal film surface with the oxidizing agent to form an oxidation layer, and shaving of the oxidation layer with the abrasive

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 2

shaving of the oxidation layer with the abrasive

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 3

removing the metal film on the elevated sections by mechanical friction between the polishing agent and the metal film on the elevated sections

Methodology Applied
Scientific EffectFriction: Friction

Data Source

PatentUS8889555B2Polishing agent for copper polishing and polishing method using same
Publication Date: 2014.11.18 RESONAC CORP
  • US8889555B2 patent drawing
  • US8889555B2 patent drawing
  • US8889555B2 patent drawing

AI summary

A polishing agent for copper polishing, comprising (A) an inorganic acid with divalent or greater valence, (B) an amino acid, (C) a protective film-forming agent, (D) an abrasive, (E) an oxidizing agent and (F) water, wherein the content of the component (A) is at least 0.08 mol/kg, the content of the component (B) is at least 0.20 mol/kg, the content of the component (C) is at least 0.02 mol/kg, and either or both of the following conditions (i) and (ii) are satisfied. (i): The proportion of the content of the component (A) with respect to the content of the component (C) is 2.00 or greater. (ii): It further comprises (G) at least one kind selected from among organic acids and their acid anhydrides.