Coreless Packaging Substrate Metal Bumps with Exposed Wing Portions

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Solution Overview

Problem

Conventional coreless packaging substrates face challenges with increased thickness due to core boards, alignment difficulties between solder balls and openings, reduced bonding force, and limited layout density due to larger metal bump areas and increased spacing between electrical pads.

Innovation Solution

A method of fabricating a coreless packaging substrate by forming electrical pads on both surfaces of a carrier board, embedding conductive elements, forming metal bumps with exposed wing portions, and using a dielectric passivation layer to ensure complete exposure of metal bump surfaces for direct chip mounting, eliminating the need for openings and enhancing bonding force and layout density.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If openings are formed on the solder mask to expose electrical pads, then solder balls can be connected to electrical pads, but alignment difficulty increases and manufacturing complexity increases

Engineering Contradiction:
Improveconnection reliabilityVSAvoidalignment difficulty
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent removes the solder mask layer from specific regions to directly expose the electrical pads, eliminating the need for openings in the solder mask. This extraction approach allows solder balls to be directly connected to electrical pads without alignment issues, as the pads are naturally exposed rather than requiring precise opening formation.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of forming openings in the solder mask to expose pads (conventional approach), the patent inverts the approach by removing the solder mask itself in specific areas, allowing the pads to be directly accessible. This reversal eliminates the alignment problem between openings and pads.

Inventive Principle:
Principle #13The other way round (Inversion)

2Reliability

If openings are formed on the solder mask to expose electrical pads, then solder balls can be connected to electrical pads, but the process complexity increases

Engineering Contradiction:
Improveconnection reliabilityVSAvoidprocess complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts the solder mask layer from specific regions where electrical pads are located, eliminating the need for complex opening formation processes. This simplifies the manufacturing process by removing unnecessary steps while maintaining reliable electrical connections.

Inventive Principle:
Principle #2Taking out (Extraction)

3Productivity

If metal bump area is reduced to improve layout density, then more pads can be arranged, but bonding force between metal bumps and chips decreases

Engineering Contradiction:
Improvelayout densityVSAvoidbonding force
Core Design Contradiction:
ProductivityVSStrength

Solution Approach 1:

The patent employs a composite structure for metal bumps consisting of a solder material layer and a copper layer. The solder material provides bonding functionality while the copper layer enhances mechanical strength and bonding force. This composite approach allows reduced bump area for higher layout density while maintaining sufficient bonding strength through the multi-layer structure.

Inventive Principle:
Principle #40Composite materials

Data Source

PatentUS9257379B2Coreless packaging substrate and method of fabricating the same
Publication Date: 2016.02.09 UNIMICRON TECH CORP
  • US9257379B2 patent drawing
  • US9257379B2 patent drawing
  • US9257379B2 patent drawing

AI summary

A coreless packaging substrate is provided which includes: a circuit buildup structure having at least a dielectric layer, at least a wiring layer and a plurality of conductive elements, a plurality of electrical pads embedded in the lowermost one of the at least a dielectric layer, a plurality of metal bumps formed on the uppermost one of the at least a wiring layer, and a dielectric passivation layer formed on the surface of the uppermost one of the circuit buildup structure and the metal bumps, with the metal bumps exposed from the dielectric passivation layer. The metal bumps each have a metal column portion and a wing portion integrally connected to the metal column portion, such that the bonding force between the metal bumps and a semiconductor chip is enhanced by the entire top surface of the wing portions of the metal bumps being completely exposed.