Counting Circuit Block for Stacked Memory Access Management
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Solution Overview
Problem
Next-generation memory devices require high integration and low power consumption with non-volatile characteristics, but existing memory devices face challenges in efficiently managing access numbers of word lines and bit lines, leading to potential drift and refresh issues.
Innovation Solution
A semiconductor system with a memory device and controller that includes a counting circuit block with x-counting blocks for word lines and y-counting blocks for bit lines, allowing for accurate counting of access numbers and timely refresh operations by alternately stacking word lines and bit lines, thereby addressing the integration and refresh challenges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a stacked memory cell structure with alternately stacked word lines and bit lines is used to achieve high integration, then the integration density is improved, but the management complexity of access numbers increases
Solution Approach 1:
The counting circuit block is segmented into multiple x-counting blocks (each handling word lines for a specific deck) and y-counting blocks (handling bit lines). This segmentation allows independent counting of access numbers for each deck, simplifying the management complexity while maintaining high integration density through the stacked structure.
2Device complexity
If access numbers of word lines and bit lines are not accurately counted, then the device complexity is reduced, but drift and refresh issues occur
Solution Approach 1:
The counting circuit block provides feedback by accurately counting and monitoring access numbers of word lines and bit lines. This feedback mechanism enables timely detection of drift conditions and triggers appropriate refresh operations, improving reliability without significantly increasing overall device complexity.
3Quantity of substance
If multiple decks share bit lines to improve integration, then the integration density is improved, but the accuracy of access number counting for individual decks decreases
Solution Approach 1:
The y-counting blocks are configured to count access numbers of bit lines for each deck separately, even when bit lines are shared across multiple decks. This segmentation enables precise measurement of access numbers for individual decks, maintaining measurement precision while achieving high integration through shared bit lines.
Data Source
AI summary
A semiconductor system may include a memory device and a controller. The memory device may include a plurality of decks. Each of the decks may include word lines and bit lines alternately stacked. The controller may control an operation for data of the decks included in the memory device. The controller may include a counting circuit block for counting access numbers of the word lines and the bit lines. The counting circuit block may include a plurality of x-counting blocks corresponding to the word lines that are stacked a plurality of y-counting blocks corresponding to the bit lines that are stacked. The x-counting blocks may count access numbers of selected word lines in accordance with a selection signal of a corresponding deck among the decks. The y-counting block may count access numbers of selected bit lines in accordance with the selection signal of the corresponding deck.


