Functional Coverage Bin Generation from Simulation Tracing
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Solution Overview
Problem
Conventional methods for generating functional coverage bins in integrated circuit testing are inefficient, as they require manual specification and do not effectively utilize constrained random simulation test results, making it difficult to determine stimulus sequences and dependencies among events.
Innovation Solution
A system and method for automatically generating functional coverage bins by tracing signal events in failing tests, correlating them to coverage bins, and creating cross-coverage event sequence bins, which can be used to improve testing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual specification of coverage bins is used, then functional coverage can be defined, but the testing process consumes excessive time and resources
Solution Approach 1:
The system automatically generates coverage bins from constrained random simulation test results without requiring manual specification. The coverage bin generation process serves itself by using simulation data to create the bins, eliminating the need for manual intervention while maintaining functional coverage definition
Solution Approach 2:
Coverage bins are generated before the actual testing process by analyzing constrained random simulation results. This preliminary generation of coverage bins based on simulation data allows the subsequent testing to proceed more efficiently without manual specification delays
2Measurement precision
If manual specification of coverage bins is used, then coverage definition can be created, but stimulus sequences and event dependencies are difficult to determine
Solution Approach 1:
The system uses feedback from constrained random simulation test results to automatically generate coverage bins. The simulation outcomes provide information about actual stimulus sequences and event dependencies, which are then used to create accurate coverage bin definitions without manual analysis
Solution Approach 2:
Constrained random simulation acts as an intermediary between the design specification and coverage bin definition. The simulation results serve as intermediate data that bridges the gap between manual specification difficulties and automated coverage generation, enabling accurate stimulus sequence determination
3Reliability
If conventional testing approaches are used, then testing can be performed, but the process is hampered by time and resource consumption
Solution Approach 1:
The system creates a copy of the testing process through constrained random simulation before actual testing. By generating coverage bins from simulation results, the system prepares testing data in advance, allowing the actual testing to be more efficient while maintaining thoroughness
Solution Approach 2:
Coverage bins are generated in advance from constrained random simulation results before the actual testing process. This preliminary action of creating coverage bins based on simulation data reduces the time and resources needed during actual testing while maintaining testing reliability
Data Source
AI summary
A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.