CPU SETWP Test Automation via Automatic Delay Deployment
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Solution Overview
Problem
Manually adjusting the delay parameter for each command during a CPU SETWP test is time-consuming and labor-intensive, especially when errors occur, affecting the execution of decay and subsequent commands.
Innovation Solution
A method and apparatus that automatically determine and deploy the command-executing duration for the decay command and subsequent commands in the SETWP test by calculating temporal differences between signal edges, allowing for automated adjustment and correct execution without manual intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual adjustment of delay parameter is performed for each command, then the SETWP test can be executed, but it consumes a lot of time and labor
Solution Approach 1:
The system automatically adjusts the delay parameter for each command based on the command type and position, without requiring manual intervention. The testing device itself performs the parameter adjustment task that previously required human operators, thereby reducing time and labor consumption while maintaining test execution correctness.
Solution Approach 2:
The patent implements automatic change of the delay parameter based on command characteristics. Different commands (decay command, subsequent commands, final command) have different delay parameters automatically assigned by the system, eliminating the need for manual parameter adjustment while ensuring each command executes with the correct timing.
2Reliability
If manual adjustment of delay parameter is performed for each command, then the test can be executed correctly, but it is labor-intensive
Solution Approach 1:
The testing device automatically determines and adjusts the delay parameter for each command based on its internal logic and the command sequence, eliminating the need for operators to manually adjust parameters. This self-service mechanism reduces operation complexity while maintaining command execution correctness.
Solution Approach 2:
The system pre-configures the delay parameters for different command types and positions before execution. The testing device has built-in knowledge of which delay parameter to apply for each command scenario, performing the parameter selection action in advance rather than requiring manual intervention during execution.
3Productivity
If automated method is used to determine command-executing duration, then time and labor are reduced, but the system complexity increases
Solution Approach 1:
The automated parameter adjustment is divided into distinct segments: determining the current command type, identifying the command position in the sequence, and selecting the appropriate delay parameter based on these factors. This segmentation of the automation logic makes the system more manageable and less complex than a monolithic automated system.
Solution Approach 2:
The system uses feedback from the command execution state to automatically adjust parameters. Based on whether the current command is a decay command, subsequent command, or final command, the system feedback-adjusts the delay parameter accordingly, enabling automation without requiring overly complex predetermined configurations.
Data Source
AI summary
A method and an apparatus for performing a test for a CPU, and an electronic device. A decay command in a SETWP test and a command-executing duration corresponding to each command subsequent to the decay command can be automatically deployed. Thereby, the SETWP test is correctly performed for the CPU to obtain a test result. It is not necessary to rely on manual adjustment on a parameter of a delay corresponding to each command.