Cross-Point Memory Design for Leak Current Control

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Solution Overview

Problem

It is challenging to practically design cross-point non-volatile memory devices using bipolar variable resistance elements due to unclear selection criteria for variable resistance elements and current steering elements, leading to difficulties in controlling leak currents and preventing write disturb.

Innovation Solution

A method is developed to design cross-point non-volatile memory devices with memory elements arranged in an (N×M) matrix, where each element includes a bipolar variable resistance element and a bidirectional current steering element connected in series, with specific relationships between writing voltages and currents approximated using the formula |V0|=a×Log(I)+b, allowing for the selection of coefficients N, M, VR, Ion, a, and b to minimize leak currents.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If bipolar variable resistance elements are used in cross-point memory devices, then write speed is improved, but leak current control becomes difficult

Engineering Contradiction:
Improvewrite speedVSAvoidleak current
Core Design Contradiction:
SpeedVSObject-generated harmful factors

Solution Approach 1:

A current steering element is introduced as an intermediary component between the bit line and the variable resistance element. This mediator selectively controls current flow paths, enabling fast bipolar write operations when activated while blocking leak currents when inactive, thus resolving the contradiction between write speed and leak current control

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-generated harmful factors

If current steering elements are added to control leak current, then leak current is reduced, but device complexity increases

Engineering Contradiction:
Improveleak currentVSAvoiddevice complexity
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The current steering element is designed with multi-functionality: it serves as a leak current blocker during standby, a write current controller during write operations, and a read current limiter during read operations. By consolidating multiple functions into a single component, the design achieves effective leak current control without proportionally increasing device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Loss of time

If bipolar variable resistance elements are used, then write time is reduced, but design difficulty increases due to unclear selection criteria

Engineering Contradiction:
Improvewrite timeVSAvoiddesign difficulty
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The patent establishes specific parameter relationships for bipolar variable resistance elements, including voltage thresholds (Vth1, Vth2), resistance ratios (R1/R2), and current densities (J1, J2). By defining quantitative parameter ranges and their interrelationships, the design process transitions from qualitative uncertainty to quantitative precision, enabling practical implementation while maintaining fast write performance

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the practical design of variable resistance memory devices with reduced leak currents, improving the stability and efficiency of write operations by effectively controlling the characteristics of both the variable resistance and current steering elements.

Implementation Method 1

the variable resistance element has a first threshold voltage Vth1 and a second threshold voltage Vth2, a first resistance R1 when an absolute value of a voltage applied to both ends of the variable resistance element is equal to or greater than the first threshold voltage Vth1, and a second resistance R2 when an absolute value of a voltage applied to both ends of the variable resistance element is equal to or greater than the second threshold voltage Vth2

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS8995171B2Designing method of non-volatile memory device, manufacturing method of non-volatile memory device, and non-volatile memory device
Publication Date: 2015.03.31 PANASONIC SEMICON SOLUTIONS CO LTD
  • US8995171B2 patent drawing
  • US8995171B2 patent drawing
  • US8995171B2 patent drawing

AI summary

A method of designing a cross-point non-volatile memory device including memory elements arranged in (N×M) matrix, each of the memory elements including a variable resistance element and a bidirectional current steering element connected in series with the variable resistance element, the method comprises the step of: when an absolute value of a low-resistance state writing voltage is VR and an absolute value of a current flowing through the variable resistance element having changed to a low-resistance state by application of the low-resistance state writing voltage to both ends of the variable resistance element in a high-resistance state is Ion, and a relationship between a voltage V0 applied to both ends of the bidirectional current steering element and a current I flowing through the bidirectional current steering element is approximated as |V0|=a×Log(I)+b, deciding N, M, VR, Ion, a, and b such that b−VR/2>a×[Log {(N−1)×(M−1)}−Log(Ion)] is satisfied (S101).