Cross-Voltage Sense Amplifier Error Handling

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Solution Overview

Problem

Conventional error handling circuits, such as SECDED circuits, have limited error handling capability compared to their error detecting capability, leading to reduced product yield and increased costs when more complex circuits are used to enhance error handling.

Innovation Solution

An error handling device and method that includes a cross-voltage sense amplifier capable of performing normal and cross sense operations to generate sense data, and an error handling circuit that identifies and corrects errors using the generated sense data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional error handling circuits such as SECDED circuits are used, then error detecting capability is achieved, but error handling capability is limited

Engineering Contradiction:
Improveerror handling capabilityVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The sense amplifier operates in two dynamic modes: normal sense mode for standard error detection and cross sense mode for enhanced error handling. By switching between these modes based on detected error conditions, the circuit achieves improved error handling capability without requiring a completely different hardware architecture, thus resolving the contradiction between reliability improvement and device complexity

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The sense amplifier is designed to perform multiple functions: it can operate in normal sense mode for standard error detection and in cross sense mode for additional error handling capabilities. This multi-functionality allows a single circuit to provide both error detection and enhanced error handling, improving reliability without proportionally increasing device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If more complex circuits are used to increase error handling capability, then error handling capability is improved, but product yield is lowered and cost increased

Engineering Contradiction:
Improveerror handling capabilityVSAvoidproduct yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

By implementing dynamic mode switching within the existing sense amplifier architecture, the patent achieves improved error handling capability without adding substantial hardware complexity. The circuit can adapt its operation based on error conditions, providing enhanced reliability while maintaining manufacturing simplicity and thus preserving product yield

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the operational parameters of the sense amplifier by introducing a cross sense signal that switches the amplifier between normal and cross sense modes. This parameter change enables enhanced error handling capability within the existing circuit framework, avoiding the need for more complex hardware that would reduce yield and increase cost

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The proposed solution improves read error correction performance by effectively identifying and correcting errors, thereby enhancing the reliability and yield of semiconductor memory devices without the need for more complex and costly circuits.

Implementation Method 1

perform a normal sense operation to generate normal sense data by comparing an input voltage and a comparison voltage

Methodology Applied
Scientific EffectVoltage comparison:

Implementation Method 2

perform a cross sense operation to generate cross sense data by exchanging and comparing the input voltage and the comparison voltage

Methodology Applied
Scientific EffectVoltage exchange and comparison:

Data Source

PatentUS12277987B2Error handling device, semiconductor memory device including the same, and error handling method including cross sensing operation
Publication Date: 2025.04.15 SK HYNIX INC
  • US12277987B2 patent drawing
  • US12277987B2 patent drawing
  • US12277987B2 patent drawing

AI summary

An error handling device includes a cross-voltage sense amplifier and an error handling circuit. The cross-voltage sense amplifier is configured to perform a normal sense operation and a cross sense operation. The normal sense operation generates normal sense data by providing an input voltage and a comparison voltage to first and second inputs of a comparator, respectively. The cross sense operation generates cross sense data by providing the input voltage and the comparison voltage to the second and first inputs of the comparator, respectively. The error handling circuit identifies a location of an error using the normal sense data and the cross sense data and corrects the error.