Crossed Test Contact Pins for Reliable Square and Round Leads

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Solution Overview

Problem

Existing electrical test contacts for IC devices with pin-type leads, particularly those with round or square cross-sections, struggle to establish reliable electrical connections due to positional inaccuracies and deviations, leading to failed or inaccurate tests, especially in Kelvin testing.

Innovation Solution

A crossed pair of contact pins with perpendicular arms forming a square configuration, each with inward-biased forked arms and relief cavities, ensuring electrical connection with device pins even under lateral deviations, and separate legs for connection to the load board.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If parallel contact pins are used to grip device pins, then the design works well with traditional eagle eye pins having oblong shape, but it does not perform well with device pins that have round or square cross-sections

Engineering Contradiction:
Improvecompatibility with different pin typesVSAvoidelectrical connection quality
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent transitions from a parallel contact pin arrangement to a crossed contact pin arrangement where pins intersect at approximately 90 degrees. This dimensional reconfiguration allows the contact pins to approach the device pin from multiple directions simultaneously, enabling reliable contact with round, square, and oblong pin cross-sections regardless of their orientation or lateral deviations.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If device pins have round or square cross-sections, then they offer very small contact area with parallel contact pins, but the crossed pin design establishes good electrical connection

Engineering Contradiction:
Improveelectrical connection qualityVSAvoidcontact area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

By arranging contact pins in a crossed configuration rather than parallel, the design enables contact pins to engage the device pin from multiple spatial dimensions simultaneously. This increases the effective contact area even for pins with small cross-sections like round or square profiles, as the crossed pins can contact different sides or surfaces of the device pin.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If square cross-sectioned device pins are rotated by 45° from optimal angle, then only two corners contact the parallel contact pins, but the crossed pin design maintains good connection

Engineering Contradiction:
Improveelectrical connection qualityVSAvoidpositional accuracy
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The crossed pin configuration distributes contact points across multiple orientations in space. When a square pin is rotated, the crossed pins can still engage with at least two sides of the pin due to their perpendicular arrangement, whereas parallel pins would only contact corners at specific rotation angles. This multi-directional approach compensates for rotational misalignment.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The contact assembly uses multiple contact pins with different spatial orientations working together as a composite structure. This composite arrangement ensures that regardless of the device pin's rotation or lateral position, at least some of the contact pins will establish reliable electrical connection.

Inventive Principle:
Principle #40Composite materials

4Reliability

If device pin has lateral deviation from desired position, then parallel contact pin design is not forgiving and device pin may miss one contact pin entirely, but crossed pin design maintains contact

Engineering Contradiction:
Improvetest success rateVSAvoidtolerance to positional variation
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The crossed pin arrangement creates a spatial distribution of contact points that covers a larger area and multiple directions. When a device pin deviates laterally from the ideal position, the perpendicular orientation of crossed pins ensures that the pin still intersects with multiple contact pins, whereas parallel pins arranged in a narrow configuration are more susceptible to complete miss-contact.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20260072077A1Test contact for a pin-type device with a square or round cross-section
Publication Date: 2026.03.12 JF MICROTECH
  • US20260072077A1 patent drawing
  • US20260072077A1 patent drawing
  • US20260072077A1 patent drawing

AI summary

An electrical contact for electrically connecting a device pin of an integrated circuit (IC) device-under-test and a load board of the testing apparatus, the electrical contact having a crossed pair of contact pins with each pin having a pair of upwards-extending arms that intersect perpendicularly the pair of arms of the other pin, so that all four arms form a square configuration, with each arm at a 90° angle to the arm next to it. A top pin has a bridge that saddles between the arms, and over a shoulder of the bottom pin, so that the top and bottom pins are not in contact with each other.