Crystal Structure Determination via Dynamical Diffraction Theory

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Solution Overview

Problem

Current methods for refining crystal structures using electron diffraction data are limited, particularly for general electron diffraction data, as they fail to accurately account for dynamical diffraction effects, leading to incomplete information about crystal structures, especially for non-precession electron diffraction data.

Innovation Solution

A computer-implemented method that processes three-dimensional electron diffraction data to generate virtual diffraction frames, refine crystal structures using dynamical diffraction theory, and determine absolute structures by minimizing deviations between experimental and calculated intensities, allowing for accurate determination of crystal structures without ignoring dynamic effects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If general electron diffraction data is used for crystal structure refinement, then data acquisition is simpler and more widely applicable, but measurement precision deteriorates due to unaccounted dynamical diffraction effects

Engineering Contradiction:
Improveapplicability to general electron diffraction dataVSAvoidaccuracy of crystal structure determination
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The invention changes the computational parameters and theoretical framework by implementing dynamical diffraction theory calculations instead of traditional kinematical approximation. This allows the system to accurately process general electron diffraction data while accounting for multiple scattering effects, thereby maintaining both versatility and precision.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces the simplified mechanical calculation approach (kinematical approximation) with a more sophisticated computational model (dynamical diffraction theory). This substitution enables accurate structure determination from general electron diffraction data by properly accounting for the complex physics of electron-matter interactions.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If precession electron diffraction method is used, then measurement precision improves by accounting for dynamical effects, but device complexity and ease of operation worsen due to specialized equipment requirements

Engineering Contradiction:
Improveaccuracy of intensity measurementsVSAvoidspecialized precession equipment
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention creates a computational copy of the precession electron diffraction methodology. By implementing dynamical diffraction theory calculations in software, it replicates the precision benefits of precession methods without requiring the specialized precession goniometer hardware, thus achieving high accuracy with standard electron diffraction equipment.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The invention introduces computational algorithms as an intermediary between the experimental data and the crystal structure determination. These algorithms process the raw diffraction data through dynamical diffraction theory calculations, mediating the transformation into accurate structure information without requiring complex precession hardware.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If conventional refinement methods are used for electron diffraction data, then processing speed is faster, but measurement precision deteriorates due to ignoring dynamical diffraction effects

Engineering Contradiction:
Improvespeed of structure refinementVSAvoidaccuracy of structural parameters
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The invention implements a dynamic refinement approach that adapts the computational model to account for dynamical diffraction effects during the refinement process. This allows the system to maintain processing efficiency while improving accuracy by iteratively adjusting structural parameters based on dynamical theory calculations rather than static kinematical approximations.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method provides more accurate crystal structure models, comparable to precession electron diffraction, with improved precision for non-precession data, and is suitable for a wide range of compounds, including organic and inorganic crystals, with enhanced sensitivity and reduced electron irradiation, especially beneficial for analyzing organic materials.

Implementation Method 1

obtaining electron diffraction data from the crystal by three-dimensional electron diffraction, wherein the data comprising information on the crystal diffraction patterns

Methodology Applied
Scientific EffectElectron diffraction: Diffraction

Implementation Method 2

each diffraction pattern comprising information on the scattered electron intensities in each direction

Methodology Applied
Scientific EffectScattering: Scattering

Data Source

PatentUS12072305B2Methods for determining crystal structure and apparatus for carrying out the methods
Publication Date: 2024.08.27 FYZIKALNI USTAV AV CR V V I
  • US12072305B2 patent drawing
  • US12072305B2 patent drawing
  • US12072305B2 patent drawing

AI summary

The present invention relates to a method for determining the crystal structure of a crystal (4) capable of electron diffraction. The method includes the steps of obtaining a three-dimensional electron diffraction pattern and processing data from the electron diffraction pattern. The essence of the invention is that the method of determination consists in creating virtual diffraction frames containing a list of integrated scattered electron intensities. Subsequently, the dynamical diffraction theory is used in the data processing step. In another embodiment, the invention provides an apparatus capable of performing this method.