Crystalline Orientation Mapping Using Backscattered Beam Images
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Solution Overview
Problem
Conventional crystal orientation mapping is time-consuming and memory-intensive due to the detection and storage of diffraction images at each grid point, and the detectors used are expensive.
Innovation Solution
A method involving the recording of images using a charged particle beam at different orientation settings, defined by azimuthal and elevation angles, to generate a crystalline orientation map, utilizing backscattered particles for faster image capture and reduced memory usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If diffraction images are detected and stored at each grid point using conventional crystal orientation mapping, then crystalline orientation information is obtained, but the process becomes time-consuming and memory-intensive
Solution Approach 1:
The patent extracts only the essential information needed for crystalline orientation mapping by recording simple intensity images instead of full diffraction images. By taking out only the necessary data (intensity values at different orientations) and discarding redundant information (complete diffraction patterns), the method achieves orientation mapping without the time and memory burden of conventional approaches
Solution Approach 2:
Instead of recording complete diffraction images for every grid point, the patent uses a reduced set of measurements - simple intensity images at specific orientations. This partial action approach captures sufficient information for orientation determination while significantly reducing data volume and processing time
2Measurement precision
If diffraction images are detected and stored at each grid point, then crystalline orientation information is obtained, but memory requirements increase significantly
Solution Approach 1:
The patent extracts only the essential information needed for crystalline orientation mapping by recording simple intensity images instead of full diffraction images. By taking out only the necessary data (intensity values at different orientations) and discarding redundant information (complete diffraction patterns), the method achieves orientation mapping without the time and memory burden of conventional approaches
Solution Approach 2:
The patent replaces expensive, large-memory diffraction image storage with simple, minimal intensity value recordings. Each measurement point stores only essential orientation-related data rather than complete diffraction patterns, dramatically reducing memory requirements while maintaining orientation mapping capability
3Measurement precision
If a detector for detecting diffraction images is used, then crystalline orientation information is obtained, but the device cost increases
Solution Approach 1:
The patent uses simple intensity images as a copy or surrogate for the more complex diffraction images. Instead of requiring expensive specialized detectors for diffraction pattern capture, the method uses standard imaging detectors to record intensity distributions, which then serve as sufficient copies for orientation determination
Solution Approach 2:
The patent replaces expensive, large-memory diffraction image storage with simple, minimal intensity value recordings. Each measurement point stores only essential orientation-related data rather than complete diffraction patterns, dramatically reducing memory requirements while maintaining orientation mapping capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method significantly reduces the time and memory requirements for generating a crystalline orientation map while providing qualitative information on grain structures, offering a faster and more efficient alternative to conventional methods.
Implementation Method 1
recording an image of the surface portion using particles of a charged particle beam directed to the surface portion and backscattering from the surface portion
Data Source
AI summary
A method generates a crystalline orientation map of a surface portion of a sample. A crystalline orientation map represents crystalline orientations at a plurality of sample locations of the surface portion. The method comprises recording an image of the surface portion including a central location using particles of a charged particle beam directed to the surface portion and backscattering from the surface portion for each of a plurality of different orientation settings. Each of the orientation settings is defined by an azimuthal angle and an elevation angle under which the charged particle beam is incident onto the central location during the recording of the respective image. The method also includes generating the crystalline orientation map based on the recorded images.