Crystalline Sponge X-Ray Analysis with Easier Sample Handling
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Solution Overview
Problem
Conventional single-crystal X-ray structure analysis requires fine and precise operations with very small and fragile crystalline sponges, which are difficult to handle and manage, limiting its widespread use and affecting measurement results.
Innovation Solution
A single-crystal X-ray structure analysis apparatus and method that includes a sample holder with a porous complex crystal, enabling quick, sure, and easy sample soaking, information management, and installation without specialized knowledge, using a sample holder with an applicator and integrated information storage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a four-circle diffractometer is used to measure electron density distribution, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts and eliminates the unnecessary fourth circle from the diffractometer structure, reducing device complexity while maintaining measurement capability through optimized three-circle configuration
Solution Approach 2:
The three-circle diffractometer is designed to perform multiple functions including electron density distribution measurement, structural analysis, and phase determination, replacing the need for a fourth circle while maintaining comprehensive measurement capabilities
2Measurement precision
If single-crystal x-ray analysis is performed, then measurement precision is improved, but loss of time increases due to crystal growth requirements
Solution Approach 1:
The patent employs preliminary actions by pre-preparing micro-capillaries with suitable substrates and pre-planning the crystal growth conditions, which accelerates the crystal growth process and reduces the overall time required for single-crystal acquisition
Solution Approach 2:
The patent uses micro-capillaries as intermediary containers that facilitate controlled crystal growth from melt materials, enabling faster crystal formation compared to traditional methods while maintaining crystal quality for precise structural analysis
3Ease of operation
If conventional diffraction methods are used, then ease of operation is maintained, but measurement precision deteriorates for electron density distribution
Solution Approach 1:
The patent replaces conventional mechanical diffraction measurement systems with an optimized three-circle diffractometer configuration that uses sophisticated data collection and processing methods to achieve high precision electron density distribution measurements while maintaining operational ease
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates high-yield, efficient, and user-friendly single-crystal X-ray structure analysis, allowing easy management of samples and crystalline sponges, increasing the apparatus' versatility and reducing the risk of damage during handling.
Implementation Method 1
an x-ray tube for irradiating the single crystal with x-rays
Implementation Method 2
a single crystal to be irradiated by the x-rays and a detector for detecting diffraction patterns of the x-rays
Data Source
Figure 1~2
Figure 3A~3B
Figure 4
AI summary
A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided an X-ray source that generates X-rays; a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays measured by the X-ray detection measurement section; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.