Crystalline Tag Generation Using Spin Nuclei Distribution
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Solution Overview
Problem
Current tags based on NV centers in crystalline structures do not incorporate the distribution of non-zero spin elements surrounding each defect color center, limiting their security and uniqueness.
Innovation Solution
A method and system for obtaining a tag associated with a crystalline structure based on individual defect color centers and their local non-zero spin atomic distribution, using an atomic signature that includes information about the relative position and hyperfine frequency parameters of non-zero spin nuclei surrounding each defect color center.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If current tags based on NV centers are used, then the identification system can operate, but the security and uniqueness level is limited due to exclusion of non-zero spin elements distribution
Solution Approach 1:
The patent segments the identification tag into two distinct components: orientation information from defect color centers and distribution information from non-zero spin elements. This segmentation allows each component to contribute uniquely to the overall security and uniqueness of the tag, resolving the contradiction by enabling higher reliability through comprehensive information inclusion while maintaining manageable complexity through modular structure
Solution Approach 2:
The patent merges two previously separate information sources (defect color center orientation and non-zero spin elements distribution) into a unified atomic signature. This merging creates a more secure and unique identification tag by combining multiple independent characteristics, thereby improving reliability without proportionally increasing complexity since both information sources are integrated into a single composite signature
2Measurement precision
If optical response is obtained from all defect color centers collectively, then the measurement process is simplified, but the unique atomic signature information is lost
Solution Approach 1:
The patent applies segmentation by obtaining optical responses from individual defect color centers rather than collectively from all centers. This segmentation enables precise measurement of each center's unique atomic signature, including its specific non-zero spin elements distribution, thereby achieving high measurement precision while the detection system complexity is managed through systematic individual measurement approaches
Solution Approach 2:
The patent extracts unique atomic signature information from each individual defect color center, specifically isolating the distribution information of non-zero spin elements surrounding each center. This extraction process retrieves the previously lost unique information while the detection system complexity is addressed by focusing measurements on individual centers with targeted detection protocols
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The approach provides a high level of security for digital identification, authentication, and tracking applications, as the unique tag cannot be modified or created following a predefined distribution, leveraging the unique response of individual defect color centers to their local magnetic environment.
Implementation Method 1
an NV center has optical properties that allow the coupling and manipulation of spin degrees of freedom with light
Implementation Method 2
the electron spin states of the NV center can be polarized by exciting the NV centers with green light
Implementation Method 3
spin state transitions of NV centers can be characterized by optically detected magnetic resonance
Implementation Method 4
after applying an off-resonance green laser and further manipulating with microwave (MW) fields, optical transitions become accessible
Implementation Method 5
The electron spin states, hence, can be measured, for example, through the photoluminescence (PL) emitted by the NV center
Data Source
Figure 1
Figure 2~3
Figure 4A
AI summary
A method (200) for generating a tag from a crystalline structure (102) comprising at least one defect color center (104) and a plurality of non-zero spin nuclei (106) in the vicinity of each defect color center (104), the method comprising: applying (204) at least one microwave field sequence to the crystalline structure (102); applying (206) an optical radiation to the crystalline structure (102) to excite at least one defect color center; detecting (208), for at least one defect color center (104) and at least one nuclei of the plurality of non-zero spin nuclei (106) located in the vicinity thereof, a response of the crystalline structure (102); from the detected response, determining (210), by a processor (114), an atomic signature of the crystalline structure (102), said atomic signature comprising information of the non-zero spin nuclei distribution of the at least one defect color center (104); generating (212), by the processor (114), a unique tag based on the atomic signature.