X-ray CT Load Mechanism Tilt for Artifact Suppression
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Solution Overview
Problem
X-ray CT imaging of materials under test force, such as printed circuit boards or carbon fiber reinforced plastics, often results in metal artifacts due to the rotation of solder joints or fibers, making it difficult to obtain high-quality images.
Innovation Solution
An X-ray CT apparatus with a load mechanism that applies test force at an angle orthogonal to the X-ray optical axis, using an angle changing mechanism to tilt the load mechanism and minimize the occurrence of artifacts by adjusting the direction of the test force relative to the X-ray path.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray CT imaging is performed on a test piece with test force applied while rotating the stage, then three-dimensional internal structure observation is enabled, but metal artifacts occur due to solder joints revolving in a plane
Solution Approach 1:
The patent introduces a new rotational dimension by adding a second rotation axis perpendicular to the first. The load mechanism can rotate about this second axis independently, allowing solder joints to be positioned out of the imaging plane rather than revolving within it. This dimensional change transforms the artifact problem from a two-dimensional planar revolution into a three-dimensional spatial arrangement where artifacts can be positioned away from the critical imaging region.
Solution Approach 2:
The patent makes the load mechanism dynamically adjustable by enabling rotation about the second axis during the CT imaging process. This dynamic capability allows the system to continuously reposition the load mechanism and solder joints to optimal locations that minimize artifact interference, rather than being fixed in a static configuration throughout the imaging sequence.
2Measurement precision
If the load mechanism is tilted to change the direction of test force, then artifact occurrence is suppressed, but device complexity increases
Solution Approach 1:
The patent designs the load mechanism with multi-functionality by integrating two rotation capabilities into a single mechanism. The first rotation axis enables stage rotation for 3D imaging, while the second rotation axis enables load mechanism tilting for artifact suppression. This universal design allows one mechanism to perform multiple functions: applying test force, enabling 3D imaging rotation, and suppressing artifacts through tilting, rather than requiring separate mechanisms for each function.
Solution Approach 2:
The patent merges the tilting function into the existing load mechanism structure by adding a second rotation axis to the same mechanism that applies the test force. This combination integrates the artifact suppression capability directly into the load application system, eliminating the need for a separate tilting mechanism and reducing overall system complexity compared to having independent mechanisms for each function.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach suppresses the occurrence of artifacts, enabling the acquisition of high-quality X-ray CT images by ensuring that fewer metal components are aligned with the X-ray path, thereby improving image clarity.
Implementation Method 1
an X-ray irradiation unit and an X-ray detector, a stage disposed between the X-ray irradiation unit and the X-ray detector
Data Source
AI summary
The present invention provides an X-ray CT apparatus capable of obtaining a high-quality X-ray CT image by suppressing occurrence of an artifact. The X-ray CT apparatus including an X-ray imaging system including an X-ray irradiation unit and an X-ray detector, a rotating stage disposed between the X-ray irradiation unit and the X-ray detector, a rotation mechanism configured to relatively rotate the X-ray imaging system and the rotating stage about a rotation axis orthogonal to an optical axis of an X-ray that runs from the X-ray irradiation unit to the X-ray detector, and a load mechanism which is set on the stage and applies test force to a test piece includes an angle changing mechanism that tilts a bending tester to change the direction of the test force applied to the test piece by the bending tester from a direction orthogonal to the optical axis of the X-ray.