CT Artifact Correction via Scattering Reference Signals

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Computed tomography (CT) imaging devices suffer from artifacts due to X-ray scattering, which current hardware modifications, such as using grids, cannot fully address, leading to suboptimal image quality and increased production costs.

Innovation Solution

A method involving two imaging scans with and without a slit, using phantom simulations to obtain scattering and projection reference signals, which are then used to correct artifacts in the original scan data through fitting functions, thereby removing scattering and projection signals to produce artifact-free images.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If hardware modifications such as using grids are applied to reduce X-ray scattering, then scattering artifacts are reduced, but device complexity and production costs increase

Engineering Contradiction:
Improvescattering artifactsVSAvoiddevice complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent replaces mechanical hardware modifications (grids) with a software-based artifact correction method. The system uses scanning data processed through mathematical models and computational algorithms to remove scattering artifacts, eliminating the need for physical grid structures while achieving similar or superior artifact reduction

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an intermediary processing system that includes a processor and storage medium. This intermediary software system receives raw scanning data, applies correction algorithms using reference signals and fitting functions, and outputs corrected images, thereby mediating between the X-ray detection system and the final image output without requiring hardware changes

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If hardware modifications such as using grids are applied to remove scattering lines, then image quality improves, but production costs increase

Engineering Contradiction:
Improveimage qualityVSAvoidproduction costs
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent substitutes expensive physical grid hardware with a cost-effective software processing system. The artifact correction method uses computational algorithms that process existing scanning data through mathematical models, eliminating the need to purchase and install costly grid components while maintaining high image quality

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent creates a virtual copy of the scattering artifact removal process through software algorithms. Instead of physically blocking scatter radiation with grids, the system creates a digital model of scattering patterns using reference signals and fitting functions, then subtracts these models from the original scan data to produce corrected images

Inventive Principle:
Principle #26Copying

3Object-affected harmful factors

If current hardware modifications are used to address scattering, then some artifact reduction is achieved, but artifacts remain and image quality is suboptimal

Engineering Contradiction:
ImproveartifactsVSAvoidimage quality
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The patent performs preliminary actions by acquiring reference scanning data under controlled conditions (with and without phantoms) before processing actual patient scans. These reference signals are used to create fitting functions that model scattering behavior, allowing for more accurate and complete artifact removal in subsequent imaging procedures

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the approach from physical parameter modification (adding grids) to computational parameter adjustment. The system uses variable parameters in mathematical models (fitting functions with coefficients) to adaptively model and remove scattering artifacts, allowing for more precise control over artifact removal than fixed hardware configurations

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method effectively reduces artifacts in CT images, improving image quality and simplifying maintenance by eliminating the need for complex hardware modifications, while maintaining cost-effectiveness.

Implementation Method 1

The detector is the most important part of the device as it transforms the X-rays incident on it into electrical signals

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Implementation Method 2

after passing through the human body or an object, X-rays generate both transmission and scattering lines

Methodology Applied
Scientific EffectCompton Scattering: Compton Scattering

Data Source

PatentUS20240138798A1Method for removing artifact in image, electronic device, and storage medium
Publication Date: 2024.05.02 SHANGHAI UNITED IMAGING HEALTHCARE
  • US20240138798A1 patent drawing
  • US20240138798A1 patent drawing
  • US20240138798A1 patent drawing

AI summary

The present disclosure relates to a method for removing an artifact in an image, an electronic device, and a storage medium. The method includes obtaining original scan data of a target object collected by a detector during a first imaging scanning, and performing an artifact correction on the original scan data with a scattering reference signal. The original scan data includes a scattering signal. The scattering reference signal is obtained based on energy data of the detector obtained under a condition that no slit is applied and energy data of the detector obtained under a condition that a slit is applied during a second imaging scanning.